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Dispersion measurement assisted by a stimulated parametric process

Dispersion measurement assisted by a stimulated parametric process
Dispersion measurement assisted by a stimulated parametric process
Dispersion plays a major role in the behavior of light inside photonic devices. Current state-of-the-art dispersion measurement techniques utilize linear interferometers that can be applied to devices with small dispersion-length products. However, linear interferometry often requires beam alignment and phase stabilization. Recently, common-path nonlinear interferometers in the spontaneous regime have been used to demonstrate alignment-free and phase-stable dispersion measurements. However, they require single-photon detectors, resulting in high system cost and long integration times. We overcome these issues by utilizing a nonlinear interferometer in the stimulated regime and demonstrate the ability to measure the dispersion of a device with a dispersion-length product as small as 0.009 ps/nm at a precision of 0.0002 ps/nm. Moreover, this regime allows us to measure dispersion with shorter integration times (in comparison to the spontaneous regime) and conventional optical components and detectors.
0146-9592
2034-2037
Riazi, A.
c06db866-1c0c-4ad4-86e5-3d2c2827ff41
Chen, Changjia
ab034b72-03b9-4e62-9815-bca04880b116
Zhu, E.Y.
a5837a40-5106-401b-b2a7-f7b421325d02
Gladyshev, A.V.
f178f1b2-c3fa-4b63-96e8-b6e356218b84
Kazansky, P.G.
a5d123ec-8ea8-408c-8963-4a6d921fd76c
Sipe, J.E.
08c32725-d093-44ce-99ec-889cf4c70ee8
Qian, Li
3e26e957-afd2-407a-8fa8-6f15b0f70ea3
Riazi, A.
c06db866-1c0c-4ad4-86e5-3d2c2827ff41
Chen, Changjia
ab034b72-03b9-4e62-9815-bca04880b116
Zhu, E.Y.
a5837a40-5106-401b-b2a7-f7b421325d02
Gladyshev, A.V.
f178f1b2-c3fa-4b63-96e8-b6e356218b84
Kazansky, P.G.
a5d123ec-8ea8-408c-8963-4a6d921fd76c
Sipe, J.E.
08c32725-d093-44ce-99ec-889cf4c70ee8
Qian, Li
3e26e957-afd2-407a-8fa8-6f15b0f70ea3

Riazi, A., Chen, Changjia, Zhu, E.Y., Gladyshev, A.V., Kazansky, P.G., Sipe, J.E. and Qian, Li (2020) Dispersion measurement assisted by a stimulated parametric process. Optics Letters, 45 (7), 2034-2037. (doi:10.1364/OL.387283).

Record type: Article

Abstract

Dispersion plays a major role in the behavior of light inside photonic devices. Current state-of-the-art dispersion measurement techniques utilize linear interferometers that can be applied to devices with small dispersion-length products. However, linear interferometry often requires beam alignment and phase stabilization. Recently, common-path nonlinear interferometers in the spontaneous regime have been used to demonstrate alignment-free and phase-stable dispersion measurements. However, they require single-photon detectors, resulting in high system cost and long integration times. We overcome these issues by utilizing a nonlinear interferometer in the stimulated regime and demonstrate the ability to measure the dispersion of a device with a dispersion-length product as small as 0.009 ps/nm at a precision of 0.0002 ps/nm. Moreover, this regime allows us to measure dispersion with shorter integration times (in comparison to the spontaneous regime) and conventional optical components and detectors.

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More information

Accepted/In Press date: 3 March 2020
e-pub ahead of print date: 4 March 2020
Published date: 1 April 2020

Identifiers

Local EPrints ID: 442051
URI: http://eprints.soton.ac.uk/id/eprint/442051
ISSN: 0146-9592
PURE UUID: 03b9207c-f08a-439f-b9b3-62085eecee09

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Date deposited: 06 Jul 2020 16:31
Last modified: 06 Oct 2020 18:44

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Contributors

Author: A. Riazi
Author: Changjia Chen
Author: E.Y. Zhu
Author: A.V. Gladyshev
Author: P.G. Kazansky
Author: J.E. Sipe
Author: Li Qian

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