Quantitative evaluation of hard x-ray damage to biological samples using EUV ptychography
Quantitative evaluation of hard x-ray damage to biological samples using EUV ptychography
Coherent diffractive imaging (CDI) has become a standard method on a variety of synchrotron beam lines. The high brilliance short wavelength radiation from these sources can be used to reconstruct attenuation and relative phase of a sample with nanometre resolution via CDI methods. However, the interaction between the sample and high energy ionising radiation can cause degradation to sample structure. We demonstrate, using a laboratory based high harmonic generation (HHG) based extreme ultraviolet (EUV) source, imaging a sample of hippocampal neurons using the ptychography method. The significant increase in contrast of the sample in the EUV light allows identification of damage induced from exposure to 7.3 keV photons, without causing any damage to the sample itself.
Report of talk given at 13th International X-Ray Microscopy Conference (XRM), Diamond Light Source, Oxford, UK, 15-19 Aug 2017
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Baksh, Peter
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Odstrčil, Michal
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Parsons, Aaron
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Bailey, Jo
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Deinhardt, Katrin
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Chad, John E.
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Brocklesby, William S.
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Frey, Jeremy G.
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2017
Baksh, Peter
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Odstrčil, Michal
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Parsons, Aaron
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Bailey, Jo
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Deinhardt, Katrin
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Chad, John E.
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Brocklesby, William S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Frey, Jeremy G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Baksh, Peter, Odstrčil, Michal, Parsons, Aaron, Bailey, Jo, Deinhardt, Katrin, Chad, John E., Brocklesby, William S. and Frey, Jeremy G.
(2017)
Quantitative evaluation of hard x-ray damage to biological samples using EUV ptychography.
Journal of Physics Conference Series, 849 (1), , [12034].
(doi:10.1088/1742-6596/849/1/012034).
Abstract
Coherent diffractive imaging (CDI) has become a standard method on a variety of synchrotron beam lines. The high brilliance short wavelength radiation from these sources can be used to reconstruct attenuation and relative phase of a sample with nanometre resolution via CDI methods. However, the interaction between the sample and high energy ionising radiation can cause degradation to sample structure. We demonstrate, using a laboratory based high harmonic generation (HHG) based extreme ultraviolet (EUV) source, imaging a sample of hippocampal neurons using the ptychography method. The significant increase in contrast of the sample in the EUV light allows identification of damage induced from exposure to 7.3 keV photons, without causing any damage to the sample itself.
Report of talk given at 13th International X-Ray Microscopy Conference (XRM), Diamond Light Source, Oxford, UK, 15-19 Aug 2017
Text
Baksh_2017_J._Phys._Conf._Ser._849_012034
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Published date: 2017
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Local EPrints ID: 442109
URI: http://eprints.soton.ac.uk/id/eprint/442109
PURE UUID: dadf00d6-c957-49b8-9fb9-a698ac0d3fd2
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Date deposited: 07 Jul 2020 16:49
Last modified: 17 Mar 2024 03:30
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Author:
Peter Baksh
Author:
Michal Odstrčil
Author:
Aaron Parsons
Author:
Jo Bailey
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