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Wavelength and angle resolved reflectance measurements of pyramidal textures for crystalline silicon photovoltaics

Wavelength and angle resolved reflectance measurements of pyramidal textures for crystalline silicon photovoltaics
Wavelength and angle resolved reflectance measurements of pyramidal textures for crystalline silicon photovoltaics
Wavelength and angle resolved scattering (WARS) reflectance measurements are attractive to the photovoltaic (PV) industry as a means of characterizing the light-trapping properties of a textured front surface. Moreover, at the PV module level, where a stack comprising of encapsulants and glass is present, large angle scattering can promote total internal reflection at the interfaces and redirect light back towards the solar cell, thus increasing the photocurrent of the device. In this work, we present WARS measurements of a KOH-etched random pyramid surface in the 6°-90° range and identify the main paths the photons experience through reflections from various facets of the pyramids. Our results, combined with ray-tracing predictions, show that a reassessment of the morphology for simulation inputs is advised for a more comprehensive description of the experimental light paths, due to a distribution of power across multiple scattering angles and a lower average pyramid base angle. In addition, we discuss the implications on the total amount of light trapped at the glass-air interface and show that for a typical encapsulant refractive index of 1.5, approximately 14.5% of the scattered light is predicted to be trapped by the fabricated pyramidal texture. This is a significant increase over the 3.8% calculated to be trapped when assuming a dihedral base angle fixed to 54.74°.
Scattering, Light-trapping, optics, Texture, Antireflection
1062-7995
Scheul, Tudor Emilian
daf1d539-813a-4f66-b2c1-86f7e91fde8c
Khorani, Edris
bbdfbcc3-5dd0-4a73-80ed-7a0bff1d5388
Rahman, Tasmiat
e7432efa-2683-484d-9ec6-2f9c568d30cd
Charlton, Martin
fcf86ab0-8f34-411a-b576-4f684e51e274
Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Scheul, Tudor Emilian
daf1d539-813a-4f66-b2c1-86f7e91fde8c
Khorani, Edris
bbdfbcc3-5dd0-4a73-80ed-7a0bff1d5388
Rahman, Tasmiat
e7432efa-2683-484d-9ec6-2f9c568d30cd
Charlton, Martin
fcf86ab0-8f34-411a-b576-4f684e51e274
Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8

Scheul, Tudor Emilian, Khorani, Edris, Rahman, Tasmiat, Charlton, Martin and Boden, Stuart (2020) Wavelength and angle resolved reflectance measurements of pyramidal textures for crystalline silicon photovoltaics. Progress in Photovoltaics: Research and Applications. (doi:10.1002/pip.3319).

Record type: Article

Abstract

Wavelength and angle resolved scattering (WARS) reflectance measurements are attractive to the photovoltaic (PV) industry as a means of characterizing the light-trapping properties of a textured front surface. Moreover, at the PV module level, where a stack comprising of encapsulants and glass is present, large angle scattering can promote total internal reflection at the interfaces and redirect light back towards the solar cell, thus increasing the photocurrent of the device. In this work, we present WARS measurements of a KOH-etched random pyramid surface in the 6°-90° range and identify the main paths the photons experience through reflections from various facets of the pyramids. Our results, combined with ray-tracing predictions, show that a reassessment of the morphology for simulation inputs is advised for a more comprehensive description of the experimental light paths, due to a distribution of power across multiple scattering angles and a lower average pyramid base angle. In addition, we discuss the implications on the total amount of light trapped at the glass-air interface and show that for a typical encapsulant refractive index of 1.5, approximately 14.5% of the scattered light is predicted to be trapped by the fabricated pyramidal texture. This is a significant increase over the 3.8% calculated to be trapped when assuming a dihedral base angle fixed to 54.74°.

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More information

Accepted/In Press date: 28 June 2020
e-pub ahead of print date: 9 July 2020
Keywords: Scattering, Light-trapping, optics, Texture, Antireflection

Identifiers

Local EPrints ID: 442267
URI: http://eprints.soton.ac.uk/id/eprint/442267
ISSN: 1062-7995
PURE UUID: 0122ee71-5db7-45fa-a806-9595f0dd3559
ORCID for Tudor Emilian Scheul: ORCID iD orcid.org/0000-0003-4517-6096
ORCID for Stuart Boden: ORCID iD orcid.org/0000-0002-4232-1828

Catalogue record

Date deposited: 10 Jul 2020 16:31
Last modified: 07 Oct 2020 02:13

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Contributors

Author: Tudor Emilian Scheul ORCID iD
Author: Edris Khorani
Author: Tasmiat Rahman
Author: Martin Charlton
Author: Stuart Boden ORCID iD

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