Employing partially coherent, compact gas-discharge sources for coherent diffractive imaging with extreme ultraviolet light
Employing partially coherent, compact gas-discharge sources for coherent diffractive imaging with extreme ultraviolet light
 
  Coherent diffractive imaging (CDI) and related techniques enable a new type of diffraction-limited high-resolution extreme ultraviolet (EUV) microscopy. Here, we demonstrate CDI reconstruction of a complex valued object under illumination by a compact gas-discharge EUV light source emitting at 17.3 nm (O VI spectral line). The image reconstruction method accounts for the partial spatial coherence of the radiation and allows imaging even with residual background light. These results are a first step towards laboratory-scale CDI with a gas-discharge light source for applications including mask inspection for EUV lithography, metrology and astronomy.
  
  
    
      Bußmann, J.
      
        c6b074c9-d11e-47a6-8669-2201124168d1
      
     
  
    
      Odstrčil, M.
      
        b297d3ec-ed42-4709-9f90-7af79d0644c7
      
     
  
    
      Bresenitz, R.
      
        4e863a0d-16c5-4a48-80ff-dda1bfffd84f
      
     
  
    
      Rudolf, D.
      
        1d77cfa9-0b29-45e2-a30f-185dee3f12a8
      
     
  
    
      Miao, Jianwei
      
        ad0364fc-5612-4050-b6ea-eedbb7b98f72
      
     
  
    
      Brocklesby, W.S.
      
        c53ca2f6-db65-4e19-ad00-eebeb2e6de67
      
     
  
    
      Grützmacher, D.
      
        72d75987-db01-4361-b6b6-4d8bc4864c5c
      
     
  
    
      Juschkin, L.
      
        9aab7dc5-7599-48e1-93f8-77ea7adf4687
      
     
  
  
   
  
  
    
      22 September 2015
    
    
  
  
    
      Bußmann, J.
      
        c6b074c9-d11e-47a6-8669-2201124168d1
      
     
  
    
      Odstrčil, M.
      
        b297d3ec-ed42-4709-9f90-7af79d0644c7
      
     
  
    
      Bresenitz, R.
      
        4e863a0d-16c5-4a48-80ff-dda1bfffd84f
      
     
  
    
      Rudolf, D.
      
        1d77cfa9-0b29-45e2-a30f-185dee3f12a8
      
     
  
    
      Miao, Jianwei
      
        ad0364fc-5612-4050-b6ea-eedbb7b98f72
      
     
  
    
      Brocklesby, W.S.
      
        c53ca2f6-db65-4e19-ad00-eebeb2e6de67
      
     
  
    
      Grützmacher, D.
      
        72d75987-db01-4361-b6b6-4d8bc4864c5c
      
     
  
    
      Juschkin, L.
      
        9aab7dc5-7599-48e1-93f8-77ea7adf4687
      
     
  
       
    
 
  
    
      
  
  
  
  
    Bußmann, J., Odstrčil, M., Bresenitz, R., Rudolf, D., Miao, Jianwei, Brocklesby, W.S., Grützmacher, D. and Juschkin, L.
  
  
  
  
   
    (2015)
  
  
    
    Employing partially coherent, compact gas-discharge sources for coherent diffractive imaging with extreme ultraviolet light.
  
  
  
  
    
    
    
      
        
   
  
    Conference on X-Ray Lasers and Coherent X-Ray Sources - Development and Applications XI: SPIE 9589, , San Diego, CA.
   
        
        
        12 - 13  Aug 2015.
      
    
  
  
  
      
          
           8 pp
        .
    
  
  
  
   (doi:10.1117/12.2187852).
  
   
  
    
      Record type:
      Conference or Workshop Item
      (Paper)
      
      
    
   
    
      
        
          Abstract
          Coherent diffractive imaging (CDI) and related techniques enable a new type of diffraction-limited high-resolution extreme ultraviolet (EUV) microscopy. Here, we demonstrate CDI reconstruction of a complex valued object under illumination by a compact gas-discharge EUV light source emitting at 17.3 nm (O VI spectral line). The image reconstruction method accounts for the partial spatial coherence of the radiation and allows imaging even with residual background light. These results are a first step towards laboratory-scale CDI with a gas-discharge light source for applications including mask inspection for EUV lithography, metrology and astronomy.
        
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      Published date: 22 September 2015
 
    
  
  
    
  
    
  
    
     
        Venue - Dates:
        Conference on X-Ray Lasers and Coherent X-Ray Sources - Development and Applications XI: SPIE 9589, , San Diego, CA, 2015-08-12 - 2015-08-13
      
    
  
    
  
    
  
    
  
    
  
    
  
  
        Identifiers
        Local EPrints ID: 442400
        URI: http://eprints.soton.ac.uk/id/eprint/442400
        
          
        
        
        
        
          PURE UUID: 414b192b-ca15-4783-9832-dd5bdd7723d5
        
  
    
        
          
        
    
        
          
            
          
        
    
        
          
        
    
        
          
        
    
        
          
        
    
        
          
            
              
            
          
        
    
        
          
        
    
        
          
        
    
  
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  Date deposited: 14 Jul 2020 16:38
  Last modified: 17 Mar 2024 02:36
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      Contributors
      
          
          Author:
          
            
            
              J. Bußmann
            
          
        
      
          
          Author:
          
            
              
              
                M. Odstrčil
              
              
            
            
          
        
      
          
          Author:
          
            
            
              R. Bresenitz
            
          
        
      
          
          Author:
          
            
            
              D. Rudolf
            
          
        
      
          
          Author:
          
            
            
              Jianwei Miao
            
          
        
      
        
      
          
          Author:
          
            
            
              D. Grützmacher
            
          
        
      
          
          Author:
          
            
            
              L. Juschkin
            
          
        
      
      
      
    
  
   
  
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