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Full thermoelectric characterization of stoichiometric electrodeposited thin film tin selenide (SnSe)

Full thermoelectric characterization of stoichiometric electrodeposited thin film tin selenide (SnSe)
Full thermoelectric characterization of stoichiometric electrodeposited thin film tin selenide (SnSe)
Tin selenide (SnSe) has attracted much attention in the thermoelectric community since the discovery of the record figure of merit (ZT) of 2.6 in single crystal tin selenide in 2014. There have been many reports since of the thermoelectric characterization of SnSe synthesized or manufactured by several methods, but so far none of these have concerned the electrodeposition of SnSe. In this work, stoichiometric SnSe was successfully electrodeposited at −0.50 V vs SCE as shown by EDX, XPS, UPS, and XRD. The full ZT of the electrodeposits were then measured. This was done by both a delamination technique to measure the Seebeck coefficient and electrical conductivity which showed a peak power factor of 4.2 and 5.8 μW m–1 K–2 for the as deposited and heat-treated films, respectively. A novel modified transient 3ω method was used to measure the thermal conductivity of the deposited films on the deposition substrate. This revealed the thermal conductivity to be similar to the ultralow thermal conductivity of single crystal SnSe, with a value of 0.34 W m–1 K–1 being observed at 313 K.
thermoelectrics electrodeposition tin selenide SnSe thin film thermal conductivity
1944-8244
28232–28238
Nandhakumar, Iris S.
e9850fe5-1152-4df8-8a26-ed44b5564b04
Burton, Matthew Richard
4a0d87d4-48b8-46bb-8b4d-3b3cf754563b
Boyle, Connor
0e80d97b-8eb9-4d8d-bab3-e204db0ca363
Liu, Tianjun
439f7bd3-dbcb-410f-b028-b4f9bfd72fe8
McGettrick, James
1346e891-f65a-4650-b634-31c414488be8
Fenwick, Oliver
9f84a203-ee9c-4c14-ad8e-86e8f114ef2a
Carnie, Matthew
8dba3b6f-e3ca-4ea0-867f-37edefcbb885
Nandhakumar, Iris S.
e9850fe5-1152-4df8-8a26-ed44b5564b04
Burton, Matthew Richard
4a0d87d4-48b8-46bb-8b4d-3b3cf754563b
Boyle, Connor
0e80d97b-8eb9-4d8d-bab3-e204db0ca363
Liu, Tianjun
439f7bd3-dbcb-410f-b028-b4f9bfd72fe8
McGettrick, James
1346e891-f65a-4650-b634-31c414488be8
Fenwick, Oliver
9f84a203-ee9c-4c14-ad8e-86e8f114ef2a
Carnie, Matthew
8dba3b6f-e3ca-4ea0-867f-37edefcbb885

Nandhakumar, Iris S., Burton, Matthew Richard, Boyle, Connor, Liu, Tianjun, McGettrick, James, Fenwick, Oliver and Carnie, Matthew (2020) Full thermoelectric characterization of stoichiometric electrodeposited thin film tin selenide (SnSe). ACS Applied Materials and Interfaces, 12 (25), 28232–28238. (doi:10.1021/acsami.0c06026).

Record type: Article

Abstract

Tin selenide (SnSe) has attracted much attention in the thermoelectric community since the discovery of the record figure of merit (ZT) of 2.6 in single crystal tin selenide in 2014. There have been many reports since of the thermoelectric characterization of SnSe synthesized or manufactured by several methods, but so far none of these have concerned the electrodeposition of SnSe. In this work, stoichiometric SnSe was successfully electrodeposited at −0.50 V vs SCE as shown by EDX, XPS, UPS, and XRD. The full ZT of the electrodeposits were then measured. This was done by both a delamination technique to measure the Seebeck coefficient and electrical conductivity which showed a peak power factor of 4.2 and 5.8 μW m–1 K–2 for the as deposited and heat-treated films, respectively. A novel modified transient 3ω method was used to measure the thermal conductivity of the deposited films on the deposition substrate. This revealed the thermal conductivity to be similar to the ultralow thermal conductivity of single crystal SnSe, with a value of 0.34 W m–1 K–1 being observed at 313 K.

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Accepted/In Press date: 1 June 2020
Published date: 24 June 2020
Additional Information: Funding Information: The authors thank EPSRC (EP/N020863/1) for funding. All authors acknowledge the SU AIM Facility (EPSRC EP/M028267/1) for microscopy and imaging. The authors also thank COATED2 (EPSRC EP/L015099/1) for purchasing the ULVAC ZEM-3. O.F. acknowledges funding from the Royal Society (UF140372) and T.L. from the Chinese Scholarship Council. All the data created during this research are openly available from the Swansea University data archive at https://10.5281/zenodo.3707779 . Publisher Copyright: Copyright © 2020 American Chemical Society.
Keywords: thermoelectrics electrodeposition tin selenide SnSe thin film thermal conductivity

Identifiers

Local EPrints ID: 442618
URI: http://eprints.soton.ac.uk/id/eprint/442618
ISSN: 1944-8244
PURE UUID: 187c9227-2d68-4e8c-b197-cbbca3941287
ORCID for Iris S. Nandhakumar: ORCID iD orcid.org/0000-0002-9668-9126

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Date deposited: 21 Jul 2020 16:34
Last modified: 17 Mar 2024 02:46

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Contributors

Author: Matthew Richard Burton
Author: Connor Boyle
Author: Tianjun Liu
Author: James McGettrick
Author: Oliver Fenwick
Author: Matthew Carnie

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