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90nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques

90nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques
90nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques
The use of short wavelength sources for microscopy increases resolution via the diffraction limit, and allows the variation in optical contrast, such as that between carbon and water in the 2-4 nm regime, to facilitate useful imaging. However, high material absorption and consequent low phase shift, at such wavelengths limit the availability of focussing optics. For coherent illumination, the electric field just after an object can be reconstructed from its far field diffraction pattern by the process of Coherent Diffractive Imaging (CDI), which solves the well-known phase retrieval problem by iteratively applying constraints in the object and far field (Fourier) planes. Synchrotron sources have achieved 3 nm resolution using this technique.
Parsons, A.D.
4233ec59-883d-433b-ac17-6fd7a3fafa8b
Chapman, R.T.
e74a000f-babe-4fd8-ad9e-64f2ec405724
Mills, B.
05f1886e-96ef-420f-b856-4115f4ab36d0
Butcher, T.J.
77bed03c-ae8f-4e12-8c35-974150a7cc2d
Frey, J.G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Parsons, A.D.
4233ec59-883d-433b-ac17-6fd7a3fafa8b
Chapman, R.T.
e74a000f-babe-4fd8-ad9e-64f2ec405724
Mills, B.
05f1886e-96ef-420f-b856-4115f4ab36d0
Butcher, T.J.
77bed03c-ae8f-4e12-8c35-974150a7cc2d
Frey, J.G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67

Parsons, A.D., Chapman, R.T., Mills, B., Butcher, T.J., Frey, J.G. and Brocklesby, W.S. (2011) 90nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques. European Quantum Electronics Conference (CLEO/Europe-EQEC) 2011, , Munich, Germany. 22 - 26 May 2011. 1 pp . (doi:10.1109/CLEOE.2011.5942771).

Record type: Conference or Workshop Item (Paper)

Abstract

The use of short wavelength sources for microscopy increases resolution via the diffraction limit, and allows the variation in optical contrast, such as that between carbon and water in the 2-4 nm regime, to facilitate useful imaging. However, high material absorption and consequent low phase shift, at such wavelengths limit the availability of focussing optics. For coherent illumination, the electric field just after an object can be reconstructed from its far field diffraction pattern by the process of Coherent Diffractive Imaging (CDI), which solves the well-known phase retrieval problem by iteratively applying constraints in the object and far field (Fourier) planes. Synchrotron sources have achieved 3 nm resolution using this technique.

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More information

Published date: 22 May 2011
Venue - Dates: European Quantum Electronics Conference (CLEO/Europe-EQEC) 2011, , Munich, Germany, 2011-05-22 - 2011-05-26

Identifiers

Local EPrints ID: 442964
URI: http://eprints.soton.ac.uk/id/eprint/442964
PURE UUID: 761f39ed-7c10-45f7-b63c-cf4497f85591
ORCID for B. Mills: ORCID iD orcid.org/0000-0002-1784-1012
ORCID for J.G. Frey: ORCID iD orcid.org/0000-0003-0842-4302
ORCID for W.S. Brocklesby: ORCID iD orcid.org/0000-0002-2123-6712

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Date deposited: 05 Aug 2020 16:30
Last modified: 24 Sep 2021 01:40

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Contributors

Author: A.D. Parsons
Author: R.T. Chapman
Author: B. Mills ORCID iD
Author: T.J. Butcher
Author: J.G. Frey ORCID iD
Author: W.S. Brocklesby ORCID iD

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