Long working distance high resolution reflective sample imaging via structured embedded speckle illumination
Long working distance high resolution reflective sample imaging via structured embedded speckle illumination
Imaging beyond the diffraction limit at longer working distances using enhanced microscopic configurations has always been a challenge for biological and engineering samples. Even though multiple techniques have been widely used for sub-diffraction limit resolution imaging, the achievable resolution was relying on the use of objective lenses with a high numerical aperture (NA). In the case of engineering samples, in addition to sustaining higher resolutions at large working distances, improving the signal-to-noise ratio (SNR) is also critical. In this context, we propose and demonstrate a concept for high-resolution imaging at large working distances, termed as structured illumination embedded speckle microscopy. An imaging resolution of ~ 310 ± 5 nm was achieved with a microscope objective (0.55 NA; 50X) having 11 mm long working distance using a Siemen's star as the test sample. The demonstrated microscopy is therefore envisaged for engineering applications that demands high-resolution, high SNR imaging at long working distances.
Embedded speckle patterns, High SNR imaging, High-resolution imaging, Long working distance imaging, Optical microscopic imaging, Structured illumination
Haridas, Aswin
4e4d460a-1d48-4079-8c29-a6d13c328678
Perinchery, Sandeep Menon
08a4326e-ba57-48f7-8439-2a3399f4bbf4
Shinde, Anant
8ad14333-8e36-4752-b44b-a592350edfa0
Buchnev, Oleksandr
60cdb0d2-3388-47be-a066-61b3b396f69d
Murukeshan, Vadakke Matham
3d647a15-53f9-43f7-9f70-9a06c6b17af3
November 2020
Haridas, Aswin
4e4d460a-1d48-4079-8c29-a6d13c328678
Perinchery, Sandeep Menon
08a4326e-ba57-48f7-8439-2a3399f4bbf4
Shinde, Anant
8ad14333-8e36-4752-b44b-a592350edfa0
Buchnev, Oleksandr
60cdb0d2-3388-47be-a066-61b3b396f69d
Murukeshan, Vadakke Matham
3d647a15-53f9-43f7-9f70-9a06c6b17af3
Haridas, Aswin, Perinchery, Sandeep Menon, Shinde, Anant, Buchnev, Oleksandr and Murukeshan, Vadakke Matham
(2020)
Long working distance high resolution reflective sample imaging via structured embedded speckle illumination.
Optics and Lasers in Engineering, 134, [106296].
(doi:10.1016/j.optlaseng.2020.106296).
Abstract
Imaging beyond the diffraction limit at longer working distances using enhanced microscopic configurations has always been a challenge for biological and engineering samples. Even though multiple techniques have been widely used for sub-diffraction limit resolution imaging, the achievable resolution was relying on the use of objective lenses with a high numerical aperture (NA). In the case of engineering samples, in addition to sustaining higher resolutions at large working distances, improving the signal-to-noise ratio (SNR) is also critical. In this context, we propose and demonstrate a concept for high-resolution imaging at large working distances, termed as structured illumination embedded speckle microscopy. An imaging resolution of ~ 310 ± 5 nm was achieved with a microscope objective (0.55 NA; 50X) having 11 mm long working distance using a Siemen's star as the test sample. The demonstrated microscopy is therefore envisaged for engineering applications that demands high-resolution, high SNR imaging at long working distances.
Text
Long working distance high resolution reflective sample imaging via structured embedded speckle illumination
- Accepted Manuscript
More information
Accepted/In Press date: 1 July 2020
e-pub ahead of print date: 17 July 2020
Published date: November 2020
Keywords:
Embedded speckle patterns, High SNR imaging, High-resolution imaging, Long working distance imaging, Optical microscopic imaging, Structured illumination
Identifiers
Local EPrints ID: 443492
URI: http://eprints.soton.ac.uk/id/eprint/443492
ISSN: 0143-8166
PURE UUID: 9b66b548-fe17-463c-babd-dd71e6dc031f
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Date deposited: 26 Aug 2020 16:37
Last modified: 17 Mar 2024 05:50
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Contributors
Author:
Aswin Haridas
Author:
Sandeep Menon Perinchery
Author:
Anant Shinde
Author:
Oleksandr Buchnev
Author:
Vadakke Matham Murukeshan
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