The surface area and localised 3D roughness of a highly structured surface using X-Ray Computed tomography (XCT)

McBride, John and Cross, Kevin J (2020) The surface area and localised 3D roughness of a highly structured surface using X-Ray Computed tomography (XCT). Metrology Letters, [020001].

Record type: Article

Abstract

The characterisation of a highly structured surface is explored. The surface investigated has both high aspect ratio and hidden features. A regular AgNi (80/20) electrical contact has been structured using a scanning electron-beam, with the objective of wear reduction during arcing events. An X-Ray Computed tomography system (XCT) is used to provide data of the whole surface and the data then referenced against a standard calibrated high gauge confocal optical surface metrology system using standard surface metrology software. To allow the surface analysis of the XCT data, the workflow and associated data processing steps are described. The results show that the XCT method provides surface data on the whole surface area including the hidden features, but that the data resolution and associated uncertainty, limits the accuracy of the roughness evaluation. The full surface area is determined using a combination of optical and XCT data.

Text

The structured electrical contact surface using optical and XCT methods v9 - Author's Original

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