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application/pdfIEEEIEEE Photonics Journal;2020;12;5;10.1109/JPHOT.2020.3027799Ion-implantationElectrically erasableDirectional couplersMach-Zehnder InterferometerWafer scale testingElectrically Erasable Optical I/O for Wafer Scale Testing of Silicon Photonic Integrated Circuits
IEEE Photonics Journal1 Oct. 202051210.1109/JPHOT.2020.30277998
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