Modeling smectic layers in confined geometries: order parameter and defects
Modeling smectic layers in confined geometries: order parameter and defects
We identify problems with the standard complex order parameter formalism for smectic-A (SmA) liquid crystals and discuss possible alternative descriptions of smectic order. In particular, we suggest an approach based on the real smectic density variation rather than a complex order parameter. This approach gives reasonable numerical results for the smectic layer configuration and director field in sample geometries and can be used to model smectic liquid crystals under nanoscale confinement for technological applications.
1-8
Pevnyi, Mykhailo Y.
2b07b114-b280-46c7-8e5b-4c88cd4f1b9a
Selinger, Jonathan V.
32b51e10-b24c-4e10-82fa-99aff46a266b
Sluckin, Timothy J.
8dbb6b08-7034-4ae2-aa65-6b80072202f6
29 September 2014
Pevnyi, Mykhailo Y.
2b07b114-b280-46c7-8e5b-4c88cd4f1b9a
Selinger, Jonathan V.
32b51e10-b24c-4e10-82fa-99aff46a266b
Sluckin, Timothy J.
8dbb6b08-7034-4ae2-aa65-6b80072202f6
Pevnyi, Mykhailo Y., Selinger, Jonathan V. and Sluckin, Timothy J.
(2014)
Modeling smectic layers in confined geometries: order parameter and defects.
Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, 90 (3), , [032507].
(doi:10.1103/PhysRevE.90.032507).
Abstract
We identify problems with the standard complex order parameter formalism for smectic-A (SmA) liquid crystals and discuss possible alternative descriptions of smectic order. In particular, we suggest an approach based on the real smectic density variation rather than a complex order parameter. This approach gives reasonable numerical results for the smectic layer configuration and director field in sample geometries and can be used to model smectic liquid crystals under nanoscale confinement for technological applications.
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Published date: 29 September 2014
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Local EPrints ID: 444820
URI: http://eprints.soton.ac.uk/id/eprint/444820
ISSN: 1539-3755
PURE UUID: 2de9c102-39e6-4151-a8f3-ffe1d2e655c4
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Date deposited: 05 Nov 2020 17:33
Last modified: 17 Mar 2024 02:32
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Author:
Mykhailo Y. Pevnyi
Author:
Jonathan V. Selinger
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