Direct measurement of the thermoelectric properties of electrochemically deposited Bi2Te3 thin films
Direct measurement of the thermoelectric properties of electrochemically deposited Bi2Te3 thin films
The best known thermoelectric material for near room temperature heat-to-electricity conversion is bismuth telluride. Amongst the possible fabrication techniques, electrodeposition has attracted attention due to its simplicity and low cost. However, the measurement of the thermoelectric properties of electrodeposited films is challenging because of the conducting seed layer underneath the film. Here, we develop a method to directly measure the thermoelectric properties of electrodeposited bismuth telluride thin films, grown on indium tin oxide. Using this technique, the temperature dependent thermoelectric properties (Seebeck coefficient and electrical conductivity) of electrodeposited thin films have been measured down to 100 K. A parallel resistor model is employed to discern the signal of the film from the signal of the seed layer and the data are carefully analysed and contextualized with literature. Our analysis demonstrates that the thermoelectric properties of electrodeposited films can be accurately evaluated without inflicting any damage to the films.
Recatala Gomez, Jose
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Kumar, Pawan
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Suwardi, Ady
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Abutaha, Anas
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Nandhakumar, Iris S.
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Hippalgaonkar, Kedar
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1 December 2020
Recatala Gomez, Jose
d5cf1fe1-93a6-4dd0-a89c-c8f16fe6a056
Kumar, Pawan
4d7eb491-2563-4643-ac7d-0c910fa564ef
Suwardi, Ady
cedecbc2-4d36-42a5-b16d-088a71a34558
Abutaha, Anas
e8f3472c-02d2-462b-b6e6-0775101385f7
Nandhakumar, Iris S.
e9850fe5-1152-4df8-8a26-ed44b5564b04
Hippalgaonkar, Kedar
3a01d862-0650-4f5d-9f3c-215fdf4d8ad9
Recatala Gomez, Jose, Kumar, Pawan, Suwardi, Ady, Abutaha, Anas, Nandhakumar, Iris S. and Hippalgaonkar, Kedar
(2020)
Direct measurement of the thermoelectric properties of electrochemically deposited Bi2Te3 thin films.
Scientific Reports, 10 (1), [17922].
(doi:10.1038/s41598-020-74887-z).
Abstract
The best known thermoelectric material for near room temperature heat-to-electricity conversion is bismuth telluride. Amongst the possible fabrication techniques, electrodeposition has attracted attention due to its simplicity and low cost. However, the measurement of the thermoelectric properties of electrodeposited films is challenging because of the conducting seed layer underneath the film. Here, we develop a method to directly measure the thermoelectric properties of electrodeposited bismuth telluride thin films, grown on indium tin oxide. Using this technique, the temperature dependent thermoelectric properties (Seebeck coefficient and electrical conductivity) of electrodeposited thin films have been measured down to 100 K. A parallel resistor model is employed to discern the signal of the film from the signal of the seed layer and the data are carefully analysed and contextualized with literature. Our analysis demonstrates that the thermoelectric properties of electrodeposited films can be accurately evaluated without inflicting any damage to the films.
Text
s41598-020-74887-z
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Accepted/In Press date: 19 August 2020
e-pub ahead of print date: 21 October 2020
Published date: 1 December 2020
Additional Information:
Funding Information:
P.K, A.S., A.A., and K.H. acknowledge funding from the Accelerated Materials Development for Manufacturing Program at A*STAR via the AME Programmatic Fund by the Agency for Science, Technology and Research under Grant No. A1898b0043. J.R.-G. and I.N. thank A*STAR Graduate Academy’s ARAP programme for funding J.R.-G.’s graduate studies in IMRE, A*STAR.
Publisher Copyright:
© 2020, The Author(s).
Identifiers
Local EPrints ID: 445063
URI: http://eprints.soton.ac.uk/id/eprint/445063
ISSN: 2045-2322
PURE UUID: dce3184d-854c-4e7f-b157-2122e4368783
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Date deposited: 18 Nov 2020 17:34
Last modified: 17 Mar 2024 02:46
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Contributors
Author:
Jose Recatala Gomez
Author:
Pawan Kumar
Author:
Ady Suwardi
Author:
Anas Abutaha
Author:
Kedar Hippalgaonkar
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