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Two-stage architectures for resilient lightweight PUFs

Two-stage architectures for resilient lightweight PUFs
Two-stage architectures for resilient lightweight PUFs
The following topics are dealt with: Internet of Things; invasive software; security of data; program testing; reverse engineering; product codes; binary codes; decoding; maximum likelihood decoding; field programmable gate arrays.
Internet of Things, PUF, Security
IEEE
Su, Haibo
07117108-5e87-4450-9853-1d4c12d387ca
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Su, Haibo
07117108-5e87-4450-9853-1d4c12d387ca
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0

Su, Haibo, Halak, Basel and Zwolinski, Mark (2019) Two-stage architectures for resilient lightweight PUFs. In 2019 IEEE 4th International Verification and Security Workshop (IVSW). IEEE.. (doi:10.1109/IVSW.2019.8854400).

Record type: Conference or Workshop Item (Paper)

Abstract

The following topics are dealt with: Internet of Things; invasive software; security of data; program testing; reverse engineering; product codes; binary codes; decoding; maximum likelihood decoding; field programmable gate arrays.

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More information

Published date: 3 October 2019
Venue - Dates: 2019 IEEE 4th International Verification and Security Workshop (IVSW), , Rhodes Island, Greece, 2019-07-01 - 2019-07-03
Keywords: Internet of Things, PUF, Security
Learn more about School of Electronics and Computer Science research Learn more about Cyber Security research

Identifiers

Local EPrints ID: 446433
URI: http://eprints.soton.ac.uk/id/eprint/446433
DOI: doi:10.1109/IVSW.2019.8854400
PURE UUID: 3284bb3f-1888-44ca-840e-ccc1c3508b9f
ORCID for Haibo Su: ORCID iD orcid.org/0000-0003-2619-9276
ORCID for Basel Halak: ORCID iD orcid.org/0000-0003-3470-7226
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 09 Feb 2021 17:31
Last modified: 17 Mar 2024 03:25

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Contributors

Author: Haibo Su ORCID iD
Author: Basel Halak ORCID iD
Author: Mark Zwolinski ORCID iD

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