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In situ TEM observations of thickness effect on grain growth in pure titanium thin films

In situ TEM observations of thickness effect on grain growth in pure titanium thin films
In situ TEM observations of thickness effect on grain growth in pure titanium thin films

Ultrafine-grained materials have a strong tendency to transform into coarse-grained materials due to the high density of grain boundaries at elevated temperature. In this study, pure titanium was processed by high-pressure torsion for 10 turns to give an ultrafine-grained (UFG) structure with an average grain size of ~96 nm. The recrystallization behavior of the UFG Ti was investigated by in-situ transmission electron microscopy (TEM). It is found that the gradient microstructures with average grain size ranging from ~129 nm to ~655 nm are formed under in-situ TEM heating up to 800 °C for 30 min. The Kossel-Möllenstedt (K-M) fringes in a convergent-beam electron diffraction (CBED) pattern were used to provide an accurate measure of the sample thicknesses. The results demonstrate that grain growth is significantly suppressed in the UFG pure Ti thin film compared to bulk material. Mechanism analysis shows the combined effects of driving force and drag force on grain boundary migration is the primary cause of the grain growth inhibition in the UFG pure Ti thin film.

In-situ TEM heating, Thickness effect, thermal stability, titatnium, ultrafine grains
1044-5803
Ding, Chaogang
2edf8082-909e-4bec-a2b3-3b34943f5803
Chen, Wanji
42d0d66d-095e-45b3-bf8d-da81a2c6d877
Sabbaghianrad, Shima
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Xu, Jie
ff6d4656-c15b-45a4-bd71-d45937ec38fc
Shan, Debin
fd8652eb-1eeb-4ae2-bcc4-102320f3c2d7
Guo, Bin
787b3bf8-e63b-4bb8-bab5-cfa867869308
Langdon, Terence G
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
Ding, Chaogang
2edf8082-909e-4bec-a2b3-3b34943f5803
Chen, Wanji
42d0d66d-095e-45b3-bf8d-da81a2c6d877
Sabbaghianrad, Shima
2dbc35ee-f341-42fd-9081-94ef3e9b10b0
Xu, Jie
ff6d4656-c15b-45a4-bd71-d45937ec38fc
Shan, Debin
fd8652eb-1eeb-4ae2-bcc4-102320f3c2d7
Guo, Bin
787b3bf8-e63b-4bb8-bab5-cfa867869308
Langdon, Terence G
86e69b4f-e16d-4830-bf8a-5a9c11f0de86

Ding, Chaogang, Chen, Wanji, Sabbaghianrad, Shima, Xu, Jie, Shan, Debin, Guo, Bin and Langdon, Terence G (2021) In situ TEM observations of thickness effect on grain growth in pure titanium thin films. Materials Characterization, 173, [110929]. (doi:10.1016/j.matchar.2021.110929).

Record type: Article

Abstract

Ultrafine-grained materials have a strong tendency to transform into coarse-grained materials due to the high density of grain boundaries at elevated temperature. In this study, pure titanium was processed by high-pressure torsion for 10 turns to give an ultrafine-grained (UFG) structure with an average grain size of ~96 nm. The recrystallization behavior of the UFG Ti was investigated by in-situ transmission electron microscopy (TEM). It is found that the gradient microstructures with average grain size ranging from ~129 nm to ~655 nm are formed under in-situ TEM heating up to 800 °C for 30 min. The Kossel-Möllenstedt (K-M) fringes in a convergent-beam electron diffraction (CBED) pattern were used to provide an accurate measure of the sample thicknesses. The results demonstrate that grain growth is significantly suppressed in the UFG pure Ti thin film compared to bulk material. Mechanism analysis shows the combined effects of driving force and drag force on grain boundary migration is the primary cause of the grain growth inhibition in the UFG pure Ti thin film.

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JX-MC-MaterCharacter - Accepted Manuscript
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Accepted/In Press date: 24 January 2021
e-pub ahead of print date: 27 January 2021
Published date: March 2021
Additional Information: Funding Information: This work was supported by the National Natural Science Foundation of China under Grants No. 51635005 and No. 51475124, and the European Research Council under ERC Grant Agreement No. 267464-SPDMETALS. The authors are also grateful to Dr. Guohua Fan and Dr. Shu Guo of the Harbin Institute of Technology for the in-situ TEM heating tests. Funding Information: This work was supported by the National Natural Science Foundation of China under Grants No. 51635005 and No. 51475124 , and the European Research Council under ERC Grant Agreement No. 267464-SPDMETALS . The authors are also grateful to Dr. Guohua Fan and Dr. Shu Guo of the Harbin Institute of Technology for the in-situ TEM heating tests. Publisher Copyright: © 2021 Elsevier Inc.
Keywords: In-situ TEM heating, Thickness effect, thermal stability, titatnium, ultrafine grains

Identifiers

Local EPrints ID: 446963
URI: http://eprints.soton.ac.uk/id/eprint/446963
ISSN: 1044-5803
PURE UUID: ac75d306-eba1-4d97-b590-60d9f0ca5c3e
ORCID for Terence G Langdon: ORCID iD orcid.org/0000-0003-3541-9250

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Date deposited: 01 Mar 2021 17:30
Last modified: 17 Mar 2024 06:19

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Contributors

Author: Chaogang Ding
Author: Wanji Chen
Author: Shima Sabbaghianrad
Author: Jie Xu
Author: Debin Shan
Author: Bin Guo

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