The University of Southampton
University of Southampton Institutional Repository

Experimental study of arc motion near splitter plates in low voltage switching devices

Experimental study of arc motion near splitter plates in low voltage switching devices
Experimental study of arc motion near splitter plates in low voltage switching devices

Switching performance of a low-voltage switching device (LVSD) is determined by limiting current and stopping re-ignition. This is strongly influenced by how the arc moves inside the LVSD quenching chamber during the switching process. Improved switching performance is achieved when the arc quickly enters and stays inside the splitter plates of the LVSD, with the arc attached to the surface of the plates. This article studies arc motion around splitter plates in LVSDs and the correlation with arc voltage. Arc motion is investigated using a high-speed optical arc imaging system (AIS). It is observed that the arc fluctuates as it enters the splitter plates, with periods inside the plates followed by sudden re-strikes of the arc roots outside the plates. The AIS system allows the measurement of arc displacement and a correlation with the arc voltage. The results show two phases, with a narrow correlation while the arc in the chamber out of the splitter plates and a distributed correlation while in the splitter plates. Further, a new performance parameter the splitter time (ST) ratio is defined. The influence of the ST ratio on the chamber vent design is investigated. It is found that with wider and well-distributed vent apertures, the ST ratio is higher than with a closed vent, and arc motion on entry to the plates is improved.

Arc imaging system (AIS), arc motion, arc voltage, low voltage switching devices, splitter plates, vent condition
2156-3950
1452-1460
Shin, Dongkyu
1d29980e-4426-416b-858e-1b5c7734183b
Bull, Thomas
93bf0964-0be6-44a8-a4e3-f1637c509728
McBride, John
d9429c29-9361-4747-9ba3-376297cb8770
Shin, Dongkyu
1d29980e-4426-416b-858e-1b5c7734183b
Bull, Thomas
93bf0964-0be6-44a8-a4e3-f1637c509728
McBride, John
d9429c29-9361-4747-9ba3-376297cb8770

Shin, Dongkyu, Bull, Thomas and McBride, John (2021) Experimental study of arc motion near splitter plates in low voltage switching devices. IEEE Transactions on Components Packaging and Manufacturing Technology, 11 (9), 1452-1460, [9509546]. (doi:10.1109/TCPMT.2021.3103869).

Record type: Article

Abstract

Switching performance of a low-voltage switching device (LVSD) is determined by limiting current and stopping re-ignition. This is strongly influenced by how the arc moves inside the LVSD quenching chamber during the switching process. Improved switching performance is achieved when the arc quickly enters and stays inside the splitter plates of the LVSD, with the arc attached to the surface of the plates. This article studies arc motion around splitter plates in LVSDs and the correlation with arc voltage. Arc motion is investigated using a high-speed optical arc imaging system (AIS). It is observed that the arc fluctuates as it enters the splitter plates, with periods inside the plates followed by sudden re-strikes of the arc roots outside the plates. The AIS system allows the measurement of arc displacement and a correlation with the arc voltage. The results show two phases, with a narrow correlation while the arc in the chamber out of the splitter plates and a distributed correlation while in the splitter plates. Further, a new performance parameter the splitter time (ST) ratio is defined. The influence of the ST ratio on the chamber vent design is investigated. It is found that with wider and well-distributed vent apertures, the ST ratio is higher than with a closed vent, and arc motion on entry to the plates is improved.

Text
Final_PDFVersion_0808 - Accepted Manuscript
Download (1MB)

More information

Accepted/In Press date: 23 July 2021
e-pub ahead of print date: 9 August 2021
Published date: September 2021
Keywords: Arc imaging system (AIS), arc motion, arc voltage, low voltage switching devices, splitter plates, vent condition

Identifiers

Local EPrints ID: 450960
URI: http://eprints.soton.ac.uk/id/eprint/450960
ISSN: 2156-3950
PURE UUID: e50f94c7-3041-4568-8b02-69d7424d77b2
ORCID for John McBride: ORCID iD orcid.org/0000-0002-3024-0326

Catalogue record

Date deposited: 26 Aug 2021 16:33
Last modified: 18 Oct 2024 01:32

Export record

Altmetrics

Contributors

Author: Dongkyu Shin
Author: Thomas Bull
Author: John McBride ORCID iD

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×