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Compact modeling of the switching dynamics and temperature dependencies in TiOx memristors: Part I — behavioural model

Compact modeling of the switching dynamics and temperature dependencies in TiOx memristors: Part I — behavioural model
Compact modeling of the switching dynamics and temperature dependencies in TiOx memristors: Part I — behavioural model

Memristor is a promising device as a fundamental building block for future unconventional system architectures such as neuromorphic computing, reconfigurable logic, and multibit memories. Therefore, to facilitate circuit design using memristors, accurate and efficient models spanning a wide range of programming voltages and temperatures are required. In the first part of this series, we propose a behavioral model for temperature dependence of nonvolatile switching dynamics of TiOx memristors. We begin by describing pulsed resistance transients (PRTs) of the memristors and then we use a multistage methodology to establish bias and temperature dependence of the model parameters. The proposed model is then shown to accurately describe the PRT characteristics of Pt/TiOx/Au and Pt/TiOx/Pt memristors.

Behavioral model, Computational modeling, Electrical resistance measurement, Memristors, Resistance, Switches, Temperature dependence, Temperature measurement, TiOₓ memristors., metal oxide memristors, pulsed resistance transient (PRT) measurements, resistive RAMs switching dynamics, temperature dependence
1557-9646
4877 - 4884
Vaidya, Dhirendra
30b85121-48aa-4f20-9866-1acb2665bba2
Kothari, Shraddha
3f2e70a2-d830-450b-af67-fad24b6ada1a
Abbey, Thomas
64fcf5bd-e20e-4fb8-9ec4-391ad8a0a7a8
Khiat, Ali
bf549ddd-5356-4a7d-9c12-eb6c0d904050
Stathopoulos, Spyros
98d12f06-ad01-4708-be19-a97282968ee6
Michalas, Loukas
25d00d54-5900-485e-bd52-d3505fe881a7
Serb, Alexantrou
30f5ec26-f51d-42b3-85fd-0325a27a792c
Prodromakis, Themistoklis
d58c9c10-9d25-4d22-b155-06c8437acfbf
Vaidya, Dhirendra
30b85121-48aa-4f20-9866-1acb2665bba2
Kothari, Shraddha
3f2e70a2-d830-450b-af67-fad24b6ada1a
Abbey, Thomas
64fcf5bd-e20e-4fb8-9ec4-391ad8a0a7a8
Khiat, Ali
bf549ddd-5356-4a7d-9c12-eb6c0d904050
Stathopoulos, Spyros
98d12f06-ad01-4708-be19-a97282968ee6
Michalas, Loukas
25d00d54-5900-485e-bd52-d3505fe881a7
Serb, Alexantrou
30f5ec26-f51d-42b3-85fd-0325a27a792c
Prodromakis, Themistoklis
d58c9c10-9d25-4d22-b155-06c8437acfbf

Vaidya, Dhirendra, Kothari, Shraddha, Abbey, Thomas, Khiat, Ali, Stathopoulos, Spyros, Michalas, Loukas, Serb, Alexantrou and Prodromakis, Themistoklis (2021) Compact modeling of the switching dynamics and temperature dependencies in TiOx memristors: Part I — behavioural model. IEEE Transactions on Electron Devices, 68 (10), 4877 - 4884. (doi:10.1109/TED.2021.3101996).

Record type: Article

Abstract

Memristor is a promising device as a fundamental building block for future unconventional system architectures such as neuromorphic computing, reconfigurable logic, and multibit memories. Therefore, to facilitate circuit design using memristors, accurate and efficient models spanning a wide range of programming voltages and temperatures are required. In the first part of this series, we propose a behavioral model for temperature dependence of nonvolatile switching dynamics of TiOx memristors. We begin by describing pulsed resistance transients (PRTs) of the memristors and then we use a multistage methodology to establish bias and temperature dependence of the model parameters. The proposed model is then shown to accurately describe the PRT characteristics of Pt/TiOx/Au and Pt/TiOx/Pt memristors.

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Accepted/In Press date: 19 July 2021
e-pub ahead of print date: 26 August 2021
Published date: October 2021
Additional Information: Funding Information: Manuscript received July 12, 2021; accepted July 19, 2021. Date of publication August 26, 2021; date of current version September 22, 2021. This work was supported by FORTE, which is a UKRI Engineering and Physical Sciences Research Council Programme under Grant EP/R024642/1. The review of this article was arranged by Editor B. K. Kaushik. (Corresponding author: Dhirendra Vaidya.) The authors are with the Centre for Electronics Frontiers, University of Southampton, Southampton SO17 1BJ, U.K. (e-mail: dhirendra22121987@gmail.com; t.prodromakis@soton.ac.uk). Publisher Copyright: © 2021 IEEE.
Keywords: Behavioral model, Computational modeling, Electrical resistance measurement, Memristors, Resistance, Switches, Temperature dependence, Temperature measurement, TiOₓ memristors., metal oxide memristors, pulsed resistance transient (PRT) measurements, resistive RAMs switching dynamics, temperature dependence

Identifiers

Local EPrints ID: 451399
URI: http://eprints.soton.ac.uk/id/eprint/451399
ISSN: 1557-9646
PURE UUID: cce47041-db64-447e-9cbf-1a233c8a4cb6
ORCID for Spyros Stathopoulos: ORCID iD orcid.org/0000-0002-0833-6209
ORCID for Themistoklis Prodromakis: ORCID iD orcid.org/0000-0002-6267-6909

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Date deposited: 23 Sep 2021 16:40
Last modified: 16 Mar 2024 13:38

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Contributors

Author: Dhirendra Vaidya
Author: Shraddha Kothari
Author: Thomas Abbey
Author: Ali Khiat
Author: Spyros Stathopoulos ORCID iD
Author: Loukas Michalas
Author: Alexantrou Serb
Author: Themistoklis Prodromakis ORCID iD

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