Coherent X-ray diffraction imaging for strain analysis on single ZnO nanorod
Coherent X-ray diffraction imaging for strain analysis on single ZnO nanorod
Strain induced in nanostructure semiconductor materials can result in different electronic properties. Coherent x-ray diffraction (CXD) has emerged as a non-destructive tool for imaging of strain and defects. In this work CXD is applied on a single ZnO nanorod, diffraction patterns from Bragg reflection are used to reconstruct the strain distribution in the samples at a resolution of 40 nm.
1069
Xiong, Gang
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Leake, Steven J.
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Newton, Marcus
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Huang, X.
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Harder, Ross
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Robinson, Ian K.
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2011
Xiong, Gang
c8b84eb3-869c-4175-8cc4-1aaf3269332c
Leake, Steven J.
4a7e3727-00b4-46dc-934a-00ccdcecb17a
Newton, Marcus
fac92cce-a9f3-46cd-9f58-c810f7b49c7e
Huang, X.
7885f222-0af4-44d9-a839-393e2e3a8e3e
Harder, Ross
05fa0b22-abf6-4f59-9823-1748e879e27c
Robinson, Ian K.
ce840296-d065-463a-9986-573de845a081
Xiong, Gang, Leake, Steven J., Newton, Marcus, Huang, X., Harder, Ross and Robinson, Ian K.
(2011)
Coherent X-ray diffraction imaging for strain analysis on single ZnO nanorod.
In AIP Conference Proceedings.
vol. 1399,
AIP Publishing.
.
(doi:10.1063/1.3666747).
Record type:
Conference or Workshop Item
(Paper)
Abstract
Strain induced in nanostructure semiconductor materials can result in different electronic properties. Coherent x-ray diffraction (CXD) has emerged as a non-destructive tool for imaging of strain and defects. In this work CXD is applied on a single ZnO nanorod, diffraction patterns from Bragg reflection are used to reconstruct the strain distribution in the samples at a resolution of 40 nm.
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e-pub ahead of print date: 28 December 2011
Published date: 2011
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Local EPrints ID: 451656
URI: http://eprints.soton.ac.uk/id/eprint/451656
PURE UUID: 40d30833-d5fc-47a6-aa10-32368919d5c4
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Date deposited: 18 Oct 2021 16:31
Last modified: 17 Mar 2024 03:33
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Contributors
Author:
Gang Xiong
Author:
Steven J. Leake
Author:
X. Huang
Author:
Ross Harder
Author:
Ian K. Robinson
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