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Coherent X-ray diffraction imaging for strain analysis on single ZnO nanorod

Coherent X-ray diffraction imaging for strain analysis on single ZnO nanorod
Coherent X-ray diffraction imaging for strain analysis on single ZnO nanorod
Strain induced in nanostructure semiconductor materials can result in different electronic properties. Coherent x-ray diffraction (CXD) has emerged as a non-destructive tool for imaging of strain and defects. In this work CXD is applied on a single ZnO nanorod, diffraction patterns from Bragg reflection are used to reconstruct the strain distribution in the samples at a resolution of 40 nm.

1069
AIP Publishing
Xiong, Gang
c8b84eb3-869c-4175-8cc4-1aaf3269332c
Leake, Steven J.
4a7e3727-00b4-46dc-934a-00ccdcecb17a
Newton, Marcus
fac92cce-a9f3-46cd-9f58-c810f7b49c7e
Huang, X.
7885f222-0af4-44d9-a839-393e2e3a8e3e
Harder, Ross
05fa0b22-abf6-4f59-9823-1748e879e27c
Robinson, Ian K.
ce840296-d065-463a-9986-573de845a081
Xiong, Gang
c8b84eb3-869c-4175-8cc4-1aaf3269332c
Leake, Steven J.
4a7e3727-00b4-46dc-934a-00ccdcecb17a
Newton, Marcus
fac92cce-a9f3-46cd-9f58-c810f7b49c7e
Huang, X.
7885f222-0af4-44d9-a839-393e2e3a8e3e
Harder, Ross
05fa0b22-abf6-4f59-9823-1748e879e27c
Robinson, Ian K.
ce840296-d065-463a-9986-573de845a081

Xiong, Gang, Leake, Steven J., Newton, Marcus, Huang, X., Harder, Ross and Robinson, Ian K. (2011) Coherent X-ray diffraction imaging for strain analysis on single ZnO nanorod. In AIP Conference Proceedings. vol. 1399, AIP Publishing. p. 1069 . (doi:10.1063/1.3666747).

Record type: Conference or Workshop Item (Paper)

Abstract

Strain induced in nanostructure semiconductor materials can result in different electronic properties. Coherent x-ray diffraction (CXD) has emerged as a non-destructive tool for imaging of strain and defects. In this work CXD is applied on a single ZnO nanorod, diffraction patterns from Bragg reflection are used to reconstruct the strain distribution in the samples at a resolution of 40 nm.

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More information

e-pub ahead of print date: 28 December 2011
Published date: 2011

Identifiers

Local EPrints ID: 451656
URI: http://eprints.soton.ac.uk/id/eprint/451656
PURE UUID: 40d30833-d5fc-47a6-aa10-32368919d5c4
ORCID for Marcus Newton: ORCID iD orcid.org/0000-0002-4062-2117

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Date deposited: 18 Oct 2021 16:31
Last modified: 28 Oct 2021 01:46

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Contributors

Author: Gang Xiong
Author: Steven J. Leake
Author: Marcus Newton ORCID iD
Author: X. Huang
Author: Ross Harder
Author: Ian K. Robinson

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