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Technology agnostic frequency characterization methodology for memristors

Technology agnostic frequency characterization methodology for memristors
Technology agnostic frequency characterization methodology for memristors
Over the past decade memristors have been extensively studied for a number of applications, almost exclusively with DC characterization techniques. Studies of memristors in AC circuits are sparse, with only a few examples found in the literature, and characterization methods with an AC input are also sparingly used. However, publications concerning the usage of memristors in this working regime are currently on the rise. Here we propose a "technology agnostic" methodology for memristor testing in certain frequency bands. A measurement process is initially proposed, with specific instructions on sample preparation, followed by an equipment calibration and measurement protocol. This article is structured in way which aims to facilitate the usage of any available measurement equipment and it can be applied on any type of memristive technology. The second half of this work is centered around the representation of data received from following this process. Bode plot and Nyquist plot representations are considered and the information received from them is evaluated. Finally, examples of expected behaviors are given, characterizing simulated scenarios which represent different internal device models and different switching behaviors, such as capacitive or inductive switching. This study aims at providing a cohesive way for memristor characterization, to be used as a good starting point for frequency applications, and for understanding physical processes inside the devices, by streamlining the measuring process and providing a frame in which data representation and comparison will be facilitated.
AC, Methodology, characterization, memristor
2045-2322
Manouras, Vasileios
560dba43-4b76-44e0-ba9a-25ed2bcdd953
Stathopoulos, Spyros
98d12f06-ad01-4708-be19-a97282968ee6
Serb, Alexantrou
30f5ec26-f51d-42b3-85fd-0325a27a792c
Prodromakis, Themistoklis
d58c9c10-9d25-4d22-b155-06c8437acfbf
Manouras, Vasileios
560dba43-4b76-44e0-ba9a-25ed2bcdd953
Stathopoulos, Spyros
98d12f06-ad01-4708-be19-a97282968ee6
Serb, Alexantrou
30f5ec26-f51d-42b3-85fd-0325a27a792c
Prodromakis, Themistoklis
d58c9c10-9d25-4d22-b155-06c8437acfbf

Manouras, Vasileios, Stathopoulos, Spyros, Serb, Alexantrou and Prodromakis, Themistoklis (2021) Technology agnostic frequency characterization methodology for memristors. Scientific Reports, 11 (1), [20599]. (doi:10.1038/s41598-021-00001-6).

Record type: Article

Abstract

Over the past decade memristors have been extensively studied for a number of applications, almost exclusively with DC characterization techniques. Studies of memristors in AC circuits are sparse, with only a few examples found in the literature, and characterization methods with an AC input are also sparingly used. However, publications concerning the usage of memristors in this working regime are currently on the rise. Here we propose a "technology agnostic" methodology for memristor testing in certain frequency bands. A measurement process is initially proposed, with specific instructions on sample preparation, followed by an equipment calibration and measurement protocol. This article is structured in way which aims to facilitate the usage of any available measurement equipment and it can be applied on any type of memristive technology. The second half of this work is centered around the representation of data received from following this process. Bode plot and Nyquist plot representations are considered and the information received from them is evaluated. Finally, examples of expected behaviors are given, characterizing simulated scenarios which represent different internal device models and different switching behaviors, such as capacitive or inductive switching. This study aims at providing a cohesive way for memristor characterization, to be used as a good starting point for frequency applications, and for understanding physical processes inside the devices, by streamlining the measuring process and providing a frame in which data representation and comparison will be facilitated.

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Technology Agnostic Frequency Characterization Methodology for Memristors - Accepted Manuscript
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Accepted/In Press date: 30 September 2021
Published date: 18 October 2021
Keywords: AC, Methodology, characterization, memristor

Identifiers

Local EPrints ID: 451933
URI: http://eprints.soton.ac.uk/id/eprint/451933
ISSN: 2045-2322
PURE UUID: c11e5d7b-e84a-4288-8e59-0c51d0a1b14e
ORCID for Spyros Stathopoulos: ORCID iD orcid.org/0000-0002-0833-6209
ORCID for Themistoklis Prodromakis: ORCID iD orcid.org/0000-0002-6267-6909

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Date deposited: 04 Nov 2021 17:31
Last modified: 28 Apr 2022 02:14

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Contributors

Author: Vasileios Manouras
Author: Spyros Stathopoulos ORCID iD
Author: Alexantrou Serb
Author: Themistoklis Prodromakis ORCID iD

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