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Annealing effect on structural and optical properties of Se87.5Te10Sn2.5 thin films

Annealing effect on structural and optical properties of Se87.5Te10Sn2.5 thin films
Annealing effect on structural and optical properties of Se87.5Te10Sn2.5 thin films
Thin films of Se87.5Te10Sn2.5 were prepared by vacuum thermal evaporation technique. Various optical constants were calculated for the studied composition. The mechanism of the optical absorption follows the rule of direct transition. It was found that the optical energy gap (Eg) decreases from 2.26 to 1.79 eV with increasing the annealing temperature from 340 to 450 K. This result can be interpreted by the Davis and Mott model. On the other hand, the maximum value of the refractive index (n) is shifted towards the long wavelength
by increasing the annealing temperature. In addition, the high frequency dielectric constant (εL) increased from 31.26 to 48.11 whereas the ratio of the free carriers concentration to its effective of mass N/mn decreased from 4.3 to 2.09 ( 1057 (m3 Kg1
)). The influence of annealed temperature on the structure was studied by using the X-ray diffraction (XRD) and scanning electron microscopy (SEM). The XRD studies show that the as-deposited films are
amorphous in nature, but the crystallinity improved with increasing the annealing temperature. Furthermore the particle size and crystallinity increased whereas the dislocation and strains decreased with increasing the annealing temperature. SEM examination showed that the annealing temperature induced changes in the morphology of the as-deposited film.
27-34
Abdel-Rahim, M.A.
2ac8bd5e-cbf1-4d9a-adcb-65dedf244b9b
Abdel-Latief, A.Y.
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Rashad, M.
6d9ef768-bfa6-443b-9470-f508e0d3f4b4
Abdelazim, Nema
2ac8bd5e-cbf1-4d9a-adcb-65dedf244b9b
Abdel-Rahim, M.A.
2ac8bd5e-cbf1-4d9a-adcb-65dedf244b9b
Abdel-Latief, A.Y.
bf8a09fd-2897-4bca-951b-bf7678c133c5
Rashad, M.
6d9ef768-bfa6-443b-9470-f508e0d3f4b4
Abdelazim, Nema
2ac8bd5e-cbf1-4d9a-adcb-65dedf244b9b

Abdel-Rahim, M.A., Abdel-Latief, A.Y., Rashad, M. and Abdelazim, Nema (2014) Annealing effect on structural and optical properties of Se87.5Te10Sn2.5 thin films. Materials Science in Semiconductor Processing, 20, 27-34. (doi:10.1016/j.mssp.2013.12.035).

Record type: Article

Abstract

Thin films of Se87.5Te10Sn2.5 were prepared by vacuum thermal evaporation technique. Various optical constants were calculated for the studied composition. The mechanism of the optical absorption follows the rule of direct transition. It was found that the optical energy gap (Eg) decreases from 2.26 to 1.79 eV with increasing the annealing temperature from 340 to 450 K. This result can be interpreted by the Davis and Mott model. On the other hand, the maximum value of the refractive index (n) is shifted towards the long wavelength
by increasing the annealing temperature. In addition, the high frequency dielectric constant (εL) increased from 31.26 to 48.11 whereas the ratio of the free carriers concentration to its effective of mass N/mn decreased from 4.3 to 2.09 ( 1057 (m3 Kg1
)). The influence of annealed temperature on the structure was studied by using the X-ray diffraction (XRD) and scanning electron microscopy (SEM). The XRD studies show that the as-deposited films are
amorphous in nature, but the crystallinity improved with increasing the annealing temperature. Furthermore the particle size and crystallinity increased whereas the dislocation and strains decreased with increasing the annealing temperature. SEM examination showed that the annealing temperature induced changes in the morphology of the as-deposited film.

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Annealing effect on structural and optical properties of Se87.5Te10Sn2.5 thin films
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Published date: 20 January 2014

Identifiers

Local EPrints ID: 452487
URI: http://eprints.soton.ac.uk/id/eprint/452487
PURE UUID: 76c2ed0f-3a51-4348-970b-f229dd82ce93

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Date deposited: 11 Dec 2021 11:18
Last modified: 16 Mar 2024 14:22

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Contributors

Author: M.A. Abdel-Rahim
Author: A.Y. Abdel-Latief
Author: M. Rashad
Author: Nema Abdelazim

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