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Data provenance, curation and quality in metrology

Data provenance, curation and quality in metrology
Data provenance, curation and quality in metrology
Data metrology { the assessment of the quality of data { particularly in scien-tic and industrial settings, has emerged as an important requirement for theUK National Physical Laboratory (NPL) and other national metrology insti-tutes. Data provenance and data curation are key components for emergingunderstanding of data metrology. However, to date provenance research hashad limited visibility to or uptake in metrology. In this work, we summa-rize a scoping study carried out with NPL sta and industrial participants tounderstand their current and future needs for provenance, curation and dataquality. We then survey provenance technology and standards that are rele-vant to metrology. We analyse the gaps between requirements and the currentstate of the art.
167-187
World Scientific Publishing
Cheney, James
12e97098-3a1b-4231-bc34-b8cfc5e4637d
Chapman, Age
721b7321-8904-4be2-9b01-876c430743f1
Davidson, Joy
baa6770c-5411-4bb1-9612-2e53977643e0
Forbes, Alistair
1087a070-80ad-442e-8e91-53f57b28ea62
F., Pavese
Cheney, James
12e97098-3a1b-4231-bc34-b8cfc5e4637d
Chapman, Age
721b7321-8904-4be2-9b01-876c430743f1
Davidson, Joy
baa6770c-5411-4bb1-9612-2e53977643e0
Forbes, Alistair
1087a070-80ad-442e-8e91-53f57b28ea62
F., Pavese

Cheney, James, Chapman, Age, Davidson, Joy and Forbes, Alistair (2022) Data provenance, curation and quality in metrology. In, F., Pavese (ed.) Advanced Mathematical and Computational Tools in Metrology and Testing XII. (Series on Advances in Mathematics for Applied Sciences, 90) World Scientific Publishing, pp. 167-187. (doi:10.1142/9789811242380_0009).

Record type: Book Section

Abstract

Data metrology { the assessment of the quality of data { particularly in scien-tic and industrial settings, has emerged as an important requirement for theUK National Physical Laboratory (NPL) and other national metrology insti-tutes. Data provenance and data curation are key components for emergingunderstanding of data metrology. However, to date provenance research hashad limited visibility to or uptake in metrology. In this work, we summa-rize a scoping study carried out with NPL sta and industrial participants tounderstand their current and future needs for provenance, curation and dataquality. We then survey provenance technology and standards that are rele-vant to metrology. We analyse the gaps between requirements and the currentstate of the art.

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Published date: 1 February 2022

Identifiers

Local EPrints ID: 453867
URI: http://eprints.soton.ac.uk/id/eprint/453867
PURE UUID: b5f6ce04-ead7-4081-83d4-2f210fc85ece
ORCID for Age Chapman: ORCID iD orcid.org/0000-0002-3814-2587

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Date deposited: 25 Jan 2022 17:41
Last modified: 11 Jan 2023 02:51

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Contributors

Author: James Cheney
Author: Age Chapman ORCID iD
Author: Joy Davidson
Author: Alistair Forbes
Editor: Pavese F.

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