Laser tests of silicon detectors
Laser tests of silicon detectors
This paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers. Lasers of 1060 and 680 nm wavelengths were used. A sophisticated method of focusing the laser was developed. Timing and interstrip properties of modules were measured. Analysis of optical effects involved and detailed discussion about the usability of laser testing for particle detectors are presented.
Laser tests, Semiconductor detectors
12-15
Doležal, Zdeněk
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Escobar, Carlos
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Gadomski, Szymon
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Garcia, Carmen
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Gonzalez, Sergio
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Kodyš, Peter
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Kubík, Petr
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Lacasta, Carlos
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Marti, Salvador
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Mitsou, Vasiliki A.
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Moorhead, Gareth F.
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Phillips, Peter W.
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Řezníček, Pavel
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Slavík, Radan
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1 April 2007
Doležal, Zdeněk
bfcba394-a177-4315-a33d-1a883a96e87f
Escobar, Carlos
d0d77e05-4bad-408f-aed1-17a99bc3d8b1
Gadomski, Szymon
25dbfe28-1c31-445d-a5a1-c9942f3097d0
Garcia, Carmen
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Gonzalez, Sergio
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Kodyš, Peter
a6ca219f-15f7-4cf4-9b93-f8df51036635
Kubík, Petr
5578090a-10e8-4208-8b27-cb3e00a6cf21
Lacasta, Carlos
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Marti, Salvador
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Mitsou, Vasiliki A.
e92f6577-099e-4ba0-b817-5c8a5cb0ff9c
Moorhead, Gareth F.
425758a9-88f0-43aa-b601-6fd5a9e60f3b
Phillips, Peter W.
d23bf096-9c79-4ff1-9808-038121ffd806
Řezníček, Pavel
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Slavík, Radan
2591726a-ecc0-4d1a-8e1d-4d0fd8da8f7d
Doležal, Zdeněk, Escobar, Carlos, Gadomski, Szymon, Garcia, Carmen, Gonzalez, Sergio, Kodyš, Peter, Kubík, Petr, Lacasta, Carlos, Marti, Salvador, Mitsou, Vasiliki A., Moorhead, Gareth F., Phillips, Peter W., Řezníček, Pavel and Slavík, Radan
(2007)
Laser tests of silicon detectors.
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 573 (1-2), .
(doi:10.1016/j.nima.2006.10.319).
Abstract
This paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers. Lasers of 1060 and 680 nm wavelengths were used. A sophisticated method of focusing the laser was developed. Timing and interstrip properties of modules were measured. Analysis of optical effects involved and detailed discussion about the usability of laser testing for particle detectors are presented.
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More information
Published date: 1 April 2007
Additional Information:
This project was partially supported by Ministry of Education and Physical Culture of Czech Republic under the project No. 1P2004LA212 and by Grant Agency of the Czech Republic under project No. 202-03-0831. V.A.M. acknowledges support by the EU funding under the RTN contract: HPRN-CT-2002-00292, Probe for New Physics.
Venue - Dates:
7th International Conference on Position-Sensitive Detectors, , Liverpool, United Kingdom, 2005-04-09 - 2005-04-13
Keywords:
Laser tests, Semiconductor detectors
Identifiers
Local EPrints ID: 456652
URI: http://eprints.soton.ac.uk/id/eprint/456652
ISSN: 0168-9002
PURE UUID: d75b57eb-4914-431c-96c2-5c73140a9e07
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Date deposited: 05 May 2022 17:00
Last modified: 18 Mar 2024 03:12
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Contributors
Author:
Zdeněk Doležal
Author:
Carlos Escobar
Author:
Szymon Gadomski
Author:
Carmen Garcia
Author:
Sergio Gonzalez
Author:
Peter Kodyš
Author:
Petr Kubík
Author:
Carlos Lacasta
Author:
Salvador Marti
Author:
Vasiliki A. Mitsou
Author:
Gareth F. Moorhead
Author:
Peter W. Phillips
Author:
Pavel Řezníček
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