Transient otoacoustic emissions and audiogram fine structure in the extended high-frequency region
Transient otoacoustic emissions and audiogram fine structure in the extended high-frequency region
Objective: previous studies at conventional audiometric frequencies found associations between the rip-ple depth seen in audiogram fine structure (AFS) and amplitudes of both transient evoked otoacoustic emissions (TEOAEs) and overall hearing threshold levels (HTLs). These associations are explained by the cochlear mechanical theory of multiple coherent reflections of the travelling wave apically by reflections sites on the basilar membrane and basally by the stapes.
Design: the aim was to investigate whether a similar relationship is seen in the extended high-frequency (EHF) range from 8–16 kHz. Measurements from 8–16 kHz were obtained in normal-hearing subjects com-prising EHF HTLs, EHF TEOAEs using a double evoked paradigm, and Bekesy audiometry to assess AFS ripple depth and spectral periodicity.
Study Sample: twenty eight normal-hearing subjects participated.
Results: results showed no significant correlation between AFS ripple depth and either frequency-aver-aged EHF HTLs or EHF TEOAE amplitudes. The amplitude of AFS ripple depth was also lower than that seen in the conventional frequency region and spectral periodicity in the ripple more difficult to discern.
Conclusion: the results suggest a weaker interference pattern between forward and reverse cochlear travelling waves in the most basal region compared to more apical regions, or a difference in cochlear mechanical properties.
Audiogram ripple; audiogram fine structure; transient evoked otoacoustic emissions; hearing threshold level; extended high-frequency
985-994
Alenzi, Hind Maher
42f3397c-2915-4a37-a83c-e4053956e147
Lineton, Ben
1ace4e96-34da-4fc4-bc17-a1d82b2ba0e2
1 December 2021
Alenzi, Hind Maher
42f3397c-2915-4a37-a83c-e4053956e147
Lineton, Ben
1ace4e96-34da-4fc4-bc17-a1d82b2ba0e2
Alenzi, Hind Maher and Lineton, Ben
(2021)
Transient otoacoustic emissions and audiogram fine structure in the extended high-frequency region.
International Journal of Audiology, 60 (12), , [12].
(doi:10.1080/14992027.2021.1899313).
Abstract
Objective: previous studies at conventional audiometric frequencies found associations between the rip-ple depth seen in audiogram fine structure (AFS) and amplitudes of both transient evoked otoacoustic emissions (TEOAEs) and overall hearing threshold levels (HTLs). These associations are explained by the cochlear mechanical theory of multiple coherent reflections of the travelling wave apically by reflections sites on the basilar membrane and basally by the stapes.
Design: the aim was to investigate whether a similar relationship is seen in the extended high-frequency (EHF) range from 8–16 kHz. Measurements from 8–16 kHz were obtained in normal-hearing subjects com-prising EHF HTLs, EHF TEOAEs using a double evoked paradigm, and Bekesy audiometry to assess AFS ripple depth and spectral periodicity.
Study Sample: twenty eight normal-hearing subjects participated.
Results: results showed no significant correlation between AFS ripple depth and either frequency-aver-aged EHF HTLs or EHF TEOAE amplitudes. The amplitude of AFS ripple depth was also lower than that seen in the conventional frequency region and spectral periodicity in the ripple more difficult to discern.
Conclusion: the results suggest a weaker interference pattern between forward and reverse cochlear travelling waves in the most basal region compared to more apical regions, or a difference in cochlear mechanical properties.
Text
14992027.2021
- Version of Record
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Accepted/In Press date: 22 February 2021
e-pub ahead of print date: 28 March 2021
Published date: 1 December 2021
Keywords:
Audiogram ripple; audiogram fine structure; transient evoked otoacoustic emissions; hearing threshold level; extended high-frequency
Identifiers
Local EPrints ID: 456909
URI: http://eprints.soton.ac.uk/id/eprint/456909
ISSN: 1499-2027
PURE UUID: da048e6f-841d-421d-bcd5-e9e67fe1a309
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Date deposited: 17 May 2022 16:34
Last modified: 17 Mar 2024 02:56
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Author:
Hind Maher Alenzi
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