Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser

Tanaka, Yoshihito, Ito, Kiminori, Nakatani, Takashi, Onitsuka, Rena, Newton, Marcus, Sato, Takahiro, Togashi, Tadashi, Yabashi, Makina, Kawaguchi, Tomoya, Shimada, Koki, Tokuda, Kazuya, Takahashi, Isao, Ichitsubo, Tetsu, Matsubara, Eiichiro and Nishino, Yoshinori (2013) Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser. Journal of the Ceramic Society of Japan, 121 (1411), 283-286. (doi:10.2109/jcersj2.121.283).

Abstract

Ultrafast time-resolved Bragg coherent X-ray diffraction (CXD) has been performed to investigate lattice dynamics in a thin crystal layer with a nanoscale thickness by using a SASE (Self-Amplified Spontaneous Emission)-XFEL (X-ray Free Electron Laser) facility, SACLA. Single-shot Bragg coherent diffraction patterns of a 100 nm-thick silicon crystal were measured in the asymmetric configuration with a grazing exit using an area detector. The measured coherent diffraction patterns showed fringes extending in the surface normal direction. By using an optical femtosecond laser-pump and the XFEL-probe, a transient broadening of coherent diffraction pattern profile was observed at a delay time of around a few tens of picosecond, indicating transient crystal lattice fluctuation induced by the optical laser. A perspective application of the time-resolved Bragg CXD method to investigate small sized grains composing ceramic materials is discussed.

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Contributors

Author: Marcus Newton

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