The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices
The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices
University of Southampton
1977
Read, Trevor George
(1977)
The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices.
University of Southampton, Doctoral Thesis.
Record type:
Thesis
(Doctoral)
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Published date: 1977
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Local EPrints ID: 458367
URI: http://eprints.soton.ac.uk/id/eprint/458367
PURE UUID: 95ac9aad-08ad-42b8-8324-8ac7831d95e3
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Date deposited: 04 Jul 2022 16:47
Last modified: 04 Jul 2022 16:47
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Author:
Trevor George Read
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