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The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices

The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices
The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices
University of Southampton
Read, Trevor George
Read, Trevor George

Read, Trevor George (1977) The effect of mechanical stress and strain on the electrical properties of metal-oxide-semiconductor electronic devices. University of Southampton, Doctoral Thesis.

Record type: Thesis (Doctoral)

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Published date: 1977

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Local EPrints ID: 458367
URI: http://eprints.soton.ac.uk/id/eprint/458367
PURE UUID: 95ac9aad-08ad-42b8-8324-8ac7831d95e3

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Date deposited: 04 Jul 2022 16:47
Last modified: 04 Jul 2022 16:47

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Author: Trevor George Read

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