A study of thin films by ellipsometry and electron microscopy

Seward, Robert John (1967) A study of thin films by ellipsometry and electron microscopy. University of Southampton, Doctoral Thesis.

Record type: Thesis (Doctoral)

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Published date: 1967

Local EPrints ID: 459073

URI: http://eprints.soton.ac.uk/id/eprint/459073

PURE UUID: 77cbbd7f-22a7-4573-9215-2753a6f4c4f4

Date deposited: 04 Jul 2022 17:03

Last modified: 04 Jul 2022 17:03

Author: Robert John Seward

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