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An investigation of the mechanical properties of InGaASP and related materials using microhardness indentation techniques

An investigation of the mechanical properties of InGaASP and related materials using microhardness indentation techniques
An investigation of the mechanical properties of InGaASP and related materials using microhardness indentation techniques

The mechanical properties of InP, GaAs and the In1-xGaxAsyP1-y/InP system have been investigated using microhardness indentation techniques. Results indicate that indentation fracture is important in any comprehensive analysis of such measurements, even at low loads. The measured hardness of InP and GaAs was seen to decrease with increasing load, particularly for Vickers indentation, where hardness values of 370 and 580 Kg mm-2 for InP and GaAs respectively, at 50g load dropped to 360 and 565 Kg mm-2 at 300g load. Hardness measurements of In1-xGaxAs and In1-xGaxAsyP1-y layers indicated that only when the indenters penetration depth was less than a third of layer thickness (i.e. at very low loads) was a `true

University of Southampton
Watts, David Ywan
Watts, David Ywan

Watts, David Ywan (1986) An investigation of the mechanical properties of InGaASP and related materials using microhardness indentation techniques. University of Southampton, Doctoral Thesis.

Record type: Thesis (Doctoral)

Abstract

The mechanical properties of InP, GaAs and the In1-xGaxAsyP1-y/InP system have been investigated using microhardness indentation techniques. Results indicate that indentation fracture is important in any comprehensive analysis of such measurements, even at low loads. The measured hardness of InP and GaAs was seen to decrease with increasing load, particularly for Vickers indentation, where hardness values of 370 and 580 Kg mm-2 for InP and GaAs respectively, at 50g load dropped to 360 and 565 Kg mm-2 at 300g load. Hardness measurements of In1-xGaxAs and In1-xGaxAsyP1-y layers indicated that only when the indenters penetration depth was less than a third of layer thickness (i.e. at very low loads) was a `true

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Published date: 1986

Identifiers

Local EPrints ID: 460743
URI: http://eprints.soton.ac.uk/id/eprint/460743
PURE UUID: fdb980f5-8089-4bf0-82e7-b1eeb0427a62

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Date deposited: 04 Jul 2022 18:29
Last modified: 04 Jul 2022 18:29

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Author: David Ywan Watts

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