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High-Q photonic device for trapping and detecting a single atom on a chip

High-Q photonic device for trapping and detecting a single atom on a chip
High-Q photonic device for trapping and detecting a single atom on a chip
Recent progress in manufacturing high-Q dielectric microresonant structures may enable their use as photonic devices that can manipulate and/or detect single atoms on a nanometer scale. Of specific interest is the wafer-based manufacturing of resonators where good control of the physical characteristics can be achieved during fabrication and operation when integrated with other functions on the chip. We show that this "all-optical" trapping should be stable. We discuss atom detection efficiencies and the feasibility for non-destructive measurements in such systems and their dependence on key parameters such as atom distance from the surface, intensity of red- and blue-detuned laser pump fields, and disk size.
Rosenblit, Michael
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Japha, Yonathan
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Horak, Peter
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Folman, Ron
827d9cc3-f564-44fd-b3c4-725bd2a58cc0
Rosenblit, Michael
de3832aa-bc9a-4412-82d9-ef53c349091e
Japha, Yonathan
9a31a215-37ec-4782-9115-1bc92e453d76
Horak, Peter
520489b5-ccc7-4d29-bb30-c1e36436ea03
Folman, Ron
827d9cc3-f564-44fd-b3c4-725bd2a58cc0

Rosenblit, Michael, Japha, Yonathan, Horak, Peter and Folman, Ron (2006) High-Q photonic device for trapping and detecting a single atom on a chip. ICAP 2006: The 20th International Conference on Atomic Physics, Innsbruck, Austria. 16 - 21 Jul 2006. 1 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

Recent progress in manufacturing high-Q dielectric microresonant structures may enable their use as photonic devices that can manipulate and/or detect single atoms on a nanometer scale. Of specific interest is the wafer-based manufacturing of resonators where good control of the physical characteristics can be achieved during fabrication and operation when integrated with other functions on the chip. We show that this "all-optical" trapping should be stable. We discuss atom detection efficiencies and the feasibility for non-destructive measurements in such systems and their dependence on key parameters such as atom distance from the surface, intensity of red- and blue-detuned laser pump fields, and disk size.

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More information

Published date: 2006
Venue - Dates: ICAP 2006: The 20th International Conference on Atomic Physics, Innsbruck, Austria, 2006-07-16 - 2006-07-21

Identifiers

Local EPrints ID: 46160
URI: http://eprints.soton.ac.uk/id/eprint/46160
PURE UUID: 4e61c498-bd9b-4d86-8888-d6462f6a1855
ORCID for Peter Horak: ORCID iD orcid.org/0000-0002-8710-8764

Catalogue record

Date deposited: 25 May 2007
Last modified: 16 Mar 2024 03:27

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Contributors

Author: Michael Rosenblit
Author: Yonathan Japha
Author: Peter Horak ORCID iD
Author: Ron Folman

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