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Laser-induced scattering structures for metrology and distributed sensing

Laser-induced scattering structures for metrology and distributed sensing
Laser-induced scattering structures for metrology and distributed sensing
Femtosecond laser irradiation allows to modify the optical properties of transparent materials with high accuracy. In many applications, optical scattering produced by the laser irradiation is one of the major limiting factors. However,
there are situations when the scattering is responsible for the basic principle of operation of the optical element. This report reviews two research directions where laser-induced scattering can be successfully exploited.
First, spectroscopic measurements can be performed by analyzing the speckle patterns created by the scattering medium.
The measurements are made possible by the strong dependence of the speckle pattern on the wavelength of light. A scattering chip created thanks to a femtosecond laser makes allows addressing the stability problem faced by many
scattering spectrometers. The volumetric scattering centers are induced in silica substrate via micro-explosions caused by the focused laser beam. Such a spectrometer can be successfully used for interrogating fiber Bragg gratings or
interferometers.
Second example is found in optical reflectometry. This technology allows turning an optical fiber into a distributed microphone or thermometer. A single optical fiber can monitor a stretch of several tens of kilometers with an accuracy
of several meters. Such systems have wide range of applications in civil engineering, geosciences and other fields.
Reflectometry measurements are performed by observing the back-scattered light produced by the glass medium of the optical fiber. Femtosecond laser writing allows effectively increase backscattered light whilst introducing minimal
additional losses. In this way, the sensitivity of reflectometric systems can be increased or their range can be extended.
femtosecond laser writing, silica glass, optical fiber, spectrometry
0277-786X
SPIE
Falak, Przemyslaw Ludwik
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Beresna, Martynas
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Sun, Qi
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Phillips, David
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Vettenburg, Tom
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Masoudi, Ali
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Brambilla, Gilberto
815d9712-62c7-47d1-8860-9451a363a6c8
Qiao, Jie
Narazaki, Aiko
Gemini, Laura
Falak, Przemyslaw Ludwik
f414a5d1-34e8-429d-8f9a-f203b6d83324
Beresna, Martynas
a6dc062e-93c6-46a5-aeb3-8de332cdec7b
Sun, Qi
66e3c3df-5a60-4927-a47a-c4f6020c2fc0
Phillips, David
96ee79d3-d922-4f85-ac56-f4196c9377fb
Vettenburg, Tom
7bf2aadc-de2c-489e-8466-48f13595ceb2
Masoudi, Ali
8073fb9b-2e6c-46c9-89cf-cb8670d76dc0
Brambilla, Gilberto
815d9712-62c7-47d1-8860-9451a363a6c8
Qiao, Jie
Narazaki, Aiko
Gemini, Laura

Falak, Przemyslaw Ludwik, Beresna, Martynas, Sun, Qi, Phillips, David, Vettenburg, Tom, Masoudi, Ali and Brambilla, Gilberto (2022) Laser-induced scattering structures for metrology and distributed sensing. Qiao, Jie, Narazaki, Aiko and Gemini, Laura (eds.) In Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXVII. vol. 11988, SPIE. 4 pp . (doi:10.1117/12.2607775).

Record type: Conference or Workshop Item (Paper)

Abstract

Femtosecond laser irradiation allows to modify the optical properties of transparent materials with high accuracy. In many applications, optical scattering produced by the laser irradiation is one of the major limiting factors. However,
there are situations when the scattering is responsible for the basic principle of operation of the optical element. This report reviews two research directions where laser-induced scattering can be successfully exploited.
First, spectroscopic measurements can be performed by analyzing the speckle patterns created by the scattering medium.
The measurements are made possible by the strong dependence of the speckle pattern on the wavelength of light. A scattering chip created thanks to a femtosecond laser makes allows addressing the stability problem faced by many
scattering spectrometers. The volumetric scattering centers are induced in silica substrate via micro-explosions caused by the focused laser beam. Such a spectrometer can be successfully used for interrogating fiber Bragg gratings or
interferometers.
Second example is found in optical reflectometry. This technology allows turning an optical fiber into a distributed microphone or thermometer. A single optical fiber can monitor a stretch of several tens of kilometers with an accuracy
of several meters. Such systems have wide range of applications in civil engineering, geosciences and other fields.
Reflectometry measurements are performed by observing the back-scattered light produced by the glass medium of the optical fiber. Femtosecond laser writing allows effectively increase backscattered light whilst introducing minimal
additional losses. In this way, the sensitivity of reflectometric systems can be increased or their range can be extended.

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e-pub ahead of print date: 4 March 2022
Venue - Dates: SPIE Photonics West 2022, Moscone Center, San Francisco, United States, 2022-01-22 - 2022-01-27
Keywords: femtosecond laser writing, silica glass, optical fiber, spectrometry

Identifiers

Local EPrints ID: 468459
URI: http://eprints.soton.ac.uk/id/eprint/468459
ISSN: 0277-786X
PURE UUID: 61b19283-6565-4c51-a034-f5c213709f52
ORCID for Przemyslaw Ludwik Falak: ORCID iD orcid.org/0000-0002-2970-0700
ORCID for Qi Sun: ORCID iD orcid.org/0000-0002-0850-5463
ORCID for Ali Masoudi: ORCID iD orcid.org/0000-0003-0001-6080
ORCID for Gilberto Brambilla: ORCID iD orcid.org/0000-0002-5730-0499

Catalogue record

Date deposited: 16 Aug 2022 16:33
Last modified: 28 Oct 2022 02:11

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Contributors

Author: Przemyslaw Ludwik Falak ORCID iD
Author: Qi Sun ORCID iD
Author: David Phillips
Author: Tom Vettenburg
Author: Ali Masoudi ORCID iD
Editor: Jie Qiao
Editor: Aiko Narazaki
Editor: Laura Gemini

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