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SEM characterization of mm-long nanowires

SEM characterization of mm-long nanowires
SEM characterization of mm-long nanowires
The fabrication of optical fibre nanowires has recently attracted much attention [1-5]. Nanowires longer than 110mm [2] and with diameters smaller than 20 nm [5] have now been fabricated using a top-down approach. Because of the extraordinarily large ratio between length and diameter (>100000), the characterization of optical fibre nanowires requires instrumentation capable of measuring lengths over a range spanning more than five orders of magnitude. In our experiments dimensional characterization along the nanowire has been performed using an SEM and calibrated references. The samples are first attached to conductive carbon pads to avoid electrostatic build-up. Charging makes accurate metrology difficult because the electron beam can be deflected by the induced electric field on the sample. Fig. 1 illustrates a nanowire with a radius r=30nm wrapped around a microfibre with r=2µm. Variations in radius of another nanowire along its length are shown in fig. 2.
Brambilla, Gilberto
815d9712-62c7-47d1-8860-9451a363a6c8
Xu, F.
98d7620b-58a8-486d-aea1-660658579611
Richardson, D.J.
ebfe1ff9-d0c2-4e52-b7ae-c1b13bccdef3
Brambilla, Gilberto
815d9712-62c7-47d1-8860-9451a363a6c8
Xu, F.
98d7620b-58a8-486d-aea1-660658579611
Richardson, D.J.
ebfe1ff9-d0c2-4e52-b7ae-c1b13bccdef3

Brambilla, Gilberto, Xu, F. and Richardson, D.J. (2006) SEM characterization of mm-long nanowires. Nano-molecular Analysis for Emerging Technologies II (NMAET II). 17 - 18 Oct 2006.

Record type: Conference or Workshop Item (Paper)

Abstract

The fabrication of optical fibre nanowires has recently attracted much attention [1-5]. Nanowires longer than 110mm [2] and with diameters smaller than 20 nm [5] have now been fabricated using a top-down approach. Because of the extraordinarily large ratio between length and diameter (>100000), the characterization of optical fibre nanowires requires instrumentation capable of measuring lengths over a range spanning more than five orders of magnitude. In our experiments dimensional characterization along the nanowire has been performed using an SEM and calibrated references. The samples are first attached to conductive carbon pads to avoid electrostatic build-up. Charging makes accurate metrology difficult because the electron beam can be deflected by the induced electric field on the sample. Fig. 1 illustrates a nanowire with a radius r=30nm wrapped around a microfibre with r=2µm. Variations in radius of another nanowire along its length are shown in fig. 2.

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e-pub ahead of print date: 2006
Venue - Dates: Nano-molecular Analysis for Emerging Technologies II (NMAET II), 2006-10-17 - 2006-10-18

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Local EPrints ID: 46849
URI: https://eprints.soton.ac.uk/id/eprint/46849
PURE UUID: b20fdeac-0645-45fd-8918-ecf29798dafa
ORCID for D.J. Richardson: ORCID iD orcid.org/0000-0002-7751-1058

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Date deposited: 20 Jul 2007
Last modified: 14 Mar 2019 01:54

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Contributors

Author: F. Xu
Author: D.J. Richardson ORCID iD

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