Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry
Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry
A chip-scale solid-state wavelength measuring device based on a silicon photonics platform is presented. It has no moving parts and allows single-shot wavelength measurement with high precision over a nominal bandwidth of 40 nm in the Oband. The wavemeter design is based on multimode interferometer (MMI) couplers and a multi-band Mach–Zehnder interferometer (MZI) structure with exponentially increasing optical path differences and in-phase quadrature detection. The design of the MMI couplers is supported by simulations using the Finite-Difference Time-Domain (FDTD) method. The design, experimental evaluation, and calibration of the device are discussed. Observed performance indicates a spectral support of 38.069 nm (i.e., frequency bandwidth 6.608 THz), with a resolution of 8.3 pm (1σ), corresponding to 1 part in 4,587. This wavelength meter approach has emerged from a need in absolute distance measurements using frequency scanning interferometry, where knowledge of the instantaneous wavelength of a tunable laser is required to relate signal frequency with target range. We also present an adaptive delay line on a chip, demonstrate its use for range measurements, and suggest how the wavelength meter could evolve for real-time applications.
MMI, MZI, photonics, wavelength meter, wavemeter
Coggrave, C.R.
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Ruiz, P.D.
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Pallikarakis, C.A.
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Huntley, J.M.
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Du, H.
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Banakar, M.
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Yan, X.
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Tran, D.T.
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Littlejohns, C.G.
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2022
Coggrave, C.R.
0ff35596-0c4f-4a25-b413-371abf3dcbc0
Ruiz, P.D.
ea552047-ae33-4b78-89d2-6260a5bde2d3
Pallikarakis, C.A.
8f0a897c-9d1a-4cf0-88aa-b4e850f13e9a
Huntley, J.M.
37aa5375-200e-4128-a7e5-a2c20e0b6193
Du, H.
f68d2391-e6fb-4fbc-bbe0-86ce9a871352
Banakar, M.
ad56fc0a-728c-4abb-8be5-74318bb2758e
Yan, X.
e1f3f636-74e4-42d5-81c7-04feec2b85ba
Tran, D.T.
65bcfeb7-1864-4ad8-bdf3-71bd30006610
Littlejohns, C.G.
d2837f04-0a83-4bf9-acb2-618aa42a0cad
Coggrave, C.R., Ruiz, P.D., Pallikarakis, C.A., Huntley, J.M., Du, H., Banakar, M., Yan, X., Tran, D.T. and Littlejohns, C.G.
(2022)
Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry.
de Groot, Peter J., Leach, Richard K. and Picart, Pascal
(eds.)
In Proc. SPIE 12137, Optics and Photonics for Advanced Dimensional Metrology II.
vol. 12137,
6 pp
.
(doi:10.1117/12.2626785).
Record type:
Conference or Workshop Item
(Paper)
Abstract
A chip-scale solid-state wavelength measuring device based on a silicon photonics platform is presented. It has no moving parts and allows single-shot wavelength measurement with high precision over a nominal bandwidth of 40 nm in the Oband. The wavemeter design is based on multimode interferometer (MMI) couplers and a multi-band Mach–Zehnder interferometer (MZI) structure with exponentially increasing optical path differences and in-phase quadrature detection. The design of the MMI couplers is supported by simulations using the Finite-Difference Time-Domain (FDTD) method. The design, experimental evaluation, and calibration of the device are discussed. Observed performance indicates a spectral support of 38.069 nm (i.e., frequency bandwidth 6.608 THz), with a resolution of 8.3 pm (1σ), corresponding to 1 part in 4,587. This wavelength meter approach has emerged from a need in absolute distance measurements using frequency scanning interferometry, where knowledge of the instantaneous wavelength of a tunable laser is required to relate signal frequency with target range. We also present an adaptive delay line on a chip, demonstrate its use for range measurements, and suggest how the wavelength meter could evolve for real-time applications.
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Accepted/In Press date: 28 March 2022
e-pub ahead of print date: 20 May 2022
Published date: 2022
Additional Information:
Funding Information: the authors gratefully acknowledge financial support from the Engineering and Physical Sciences Research Council to the Future Metrology Hub (EP/P006930/1) and CORNERSTONE (EP/L021129/1) projects, and from the Midlands Innovation Commercialisation of Research Accelerator (MICRA) and the Enterprise Project Group from Loughborough University (EPG 134-P5 1623). We are also grateful to Renishaw PLC for valuable technical discussions.
Venue - Dates:
Advanced Dimensional Metrology II, , Strasbourg, France, 2022-04-05 - 2022-04-07
Keywords:
MMI, MZI, photonics, wavelength meter, wavemeter
Identifiers
Local EPrints ID: 468763
URI: http://eprints.soton.ac.uk/id/eprint/468763
PURE UUID: 31b15066-3574-4393-9306-018cf5f5583d
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Date deposited: 25 Aug 2022 16:33
Last modified: 16 Mar 2024 21:55
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Contributors
Author:
C.R. Coggrave
Author:
P.D. Ruiz
Author:
C.A. Pallikarakis
Author:
J.M. Huntley
Author:
H. Du
Author:
D.T. Tran
Editor:
Peter J. de Groot
Editor:
Richard K. Leach
Editor:
Pascal Picart
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