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Sputtered films of Er3+ doped gallium sulphide glass

Sputtered films of Er3+ doped gallium sulphide glass
Sputtered films of Er3+ doped gallium sulphide glass
Thin films of Er3+-doped gallium lanthanum sulfide (GLS) glass were prepared by RF magnetron sputtering onto fused silica and BK7 glass substrates. The films were characterized by use of SEM imaging, X-ray diffractometry, and energy dispersive spectroscopy. They are shown to be glassy, uniform in composition, and to exhibit an RMS surface roughness of <8Å. The fluorescence lifetimes of the 4I11/2 to 4I13/2 and 4I13/2 to 4I15/2 transitions of Er3+ were measured at each processing stage.
glasses, optical materials and properties, deposition, thin films
0167-577X
1350-1353
Frantz, J.A.
8acfcf7c-0e78-4be1-b6c1-f15e1ac924a0
Sanghera, J.S.
1309b1d1-b903-411f-a879-9c0a5caa67f5
Shaw, L.B.
670b1830-4ddc-48a4-8a41-6f22267a82b4
Villalobos, G.
4b6633fc-4ebe-4762-8036-ade50bc4a13b
Aggarwal, I.D.
e9cf0020-ccf4-401c-9d72-26f066678e0b
Hewak, D.W.
87c80070-c101-4f7a-914f-4cc3131e3db0
Frantz, J.A.
8acfcf7c-0e78-4be1-b6c1-f15e1ac924a0
Sanghera, J.S.
1309b1d1-b903-411f-a879-9c0a5caa67f5
Shaw, L.B.
670b1830-4ddc-48a4-8a41-6f22267a82b4
Villalobos, G.
4b6633fc-4ebe-4762-8036-ade50bc4a13b
Aggarwal, I.D.
e9cf0020-ccf4-401c-9d72-26f066678e0b
Hewak, D.W.
87c80070-c101-4f7a-914f-4cc3131e3db0

Frantz, J.A., Sanghera, J.S., Shaw, L.B., Villalobos, G., Aggarwal, I.D. and Hewak, D.W. (2006) Sputtered films of Er3+ doped gallium sulphide glass. Materials Letters, 60 (11), 1350-1353. (doi:10.1016/j.matlet.2005.11.028).

Record type: Article

Abstract

Thin films of Er3+-doped gallium lanthanum sulfide (GLS) glass were prepared by RF magnetron sputtering onto fused silica and BK7 glass substrates. The films were characterized by use of SEM imaging, X-ray diffractometry, and energy dispersive spectroscopy. They are shown to be glassy, uniform in composition, and to exhibit an RMS surface roughness of <8Å. The fluorescence lifetimes of the 4I11/2 to 4I13/2 and 4I13/2 to 4I15/2 transitions of Er3+ were measured at each processing stage.

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Published date: 2006
Keywords: glasses, optical materials and properties, deposition, thin films
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Identifiers

Local EPrints ID: 46922
URI: http://eprints.soton.ac.uk/id/eprint/46922
DOI: doi:10.1016/j.matlet.2005.11.028
ISSN: 0167-577X
PURE UUID: 8b8a57dc-3c26-4c76-953b-8906f3736ce7
ORCID for D.W. Hewak: ORCID iD orcid.org/0000-0002-2093-5773

Catalogue record

Date deposited: 24 Jul 2007
Last modified: 15 Mar 2024 09:29

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Contributors

Author: J.A. Frantz
Author: J.S. Sanghera
Author: L.B. Shaw
Author: G. Villalobos
Author: I.D. Aggarwal
Author: D.W. Hewak ORCID iD

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