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An elliptical Talbot interferometer for fiber Bragg grating fabrication

An elliptical Talbot interferometer for fiber Bragg grating fabrication
An elliptical Talbot interferometer for fiber Bragg grating fabrication
A simple and easily aligned two-mirror interferometer for fabricating Bragg gratings in optical bulk materials, waveguides, and fibers is presented. The interferometer consists of a simple phase mask splitting element and two dielectric mirrors optimized for maximum reflectance at an incident angle of 45 deg. By choosing a suitable optical configuration the half-period of the phase mask is patterned on the interference plane, while a wide range of periodicities can be inscribed by adjusting the relative angles between the interferometer folding mirrors. The operation of the interferometer is demonstrated for grating inscription in Ge-doped optical fibers, using 213 nm, 150 ps Nd:YAG radiation.
0034-6748
1-3
Pissadakis, Stavros
5d10fc13-b5ac-455f-90a0-c1c92ee091dd
Reekie, Laurence
61f4bd1d-7369-4017-90d8-d79ace46424a
Pissadakis, Stavros
5d10fc13-b5ac-455f-90a0-c1c92ee091dd
Reekie, Laurence
61f4bd1d-7369-4017-90d8-d79ace46424a

Pissadakis, Stavros and Reekie, Laurence (2005) An elliptical Talbot interferometer for fiber Bragg grating fabrication. Review of Scientific Instruments, 76 (66101), 1-3. (doi:10.1063/1.1921247).

Record type: Article

Abstract

A simple and easily aligned two-mirror interferometer for fabricating Bragg gratings in optical bulk materials, waveguides, and fibers is presented. The interferometer consists of a simple phase mask splitting element and two dielectric mirrors optimized for maximum reflectance at an incident angle of 45 deg. By choosing a suitable optical configuration the half-period of the phase mask is patterned on the interference plane, while a wide range of periodicities can be inscribed by adjusting the relative angles between the interferometer folding mirrors. The operation of the interferometer is demonstrated for grating inscription in Ge-doped optical fibers, using 213 nm, 150 ps Nd:YAG radiation.

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Published date: June 2005

Identifiers

Local EPrints ID: 46952
URI: https://eprints.soton.ac.uk/id/eprint/46952
ISSN: 0034-6748
PURE UUID: 4bace619-b852-4441-a670-758d8d0899dd

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Date deposited: 24 Jul 2007
Last modified: 13 Mar 2019 21:01

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Contributors

Author: Stavros Pissadakis
Author: Laurence Reekie

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