Group 14: Challenge: Defect detection in graphene sheets
Group 14: Challenge: Defect detection in graphene sheets
Try to use machine learning method to accurately classify different types of TEM images of atom lattice of mono layer Graphenes, see Figure1.
AI3SD, Machine Learning, Summer School
University of Southampton
Bao, Peng
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Macklin, Jack
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Gheasi, Masood
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Frey, Jeremy G.
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Niranjan, Mahesan
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Kanza, Samantha
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30 June 2022
Bao, Peng
eb09f5f9-eb49-4efe-9c4c-92baee80f5a5
Macklin, Jack
82328ebd-5aa6-4279-abb7-17e726c99da1
Gheasi, Masood
0e1a0af4-3f82-4498-a5e5-4f7f7618d68e
Frey, Jeremy G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Niranjan, Mahesan
5cbaeea8-7288-4b55-a89c-c43d212ddd4f
Kanza, Samantha
b73bcf34-3ff8-4691-bd09-aa657dcff420
Bao, Peng, Macklin, Jack and Gheasi, Masood
,
Frey, Jeremy G., Niranjan, Mahesan and Kanza, Samantha
(eds.)
(2022)
Group 14: Challenge: Defect detection in graphene sheets
University of Southampton
15pp.
(doi:10.5258/SOTON/AI3SD0250).
Record type:
Monograph
(Project Report)
Abstract
Try to use machine learning method to accurately classify different types of TEM images of atom lattice of mono layer Graphenes, see Figure1.
Text
MLSummerSchoolReport_Group 14
- Version of Record
More information
Published date: 30 June 2022
Venue - Dates:
AI4SD Machine Learning Summer School, University of Southampton, Southampton, United Kingdom, 2022-06-20 - 2022-06-24
Keywords:
AI3SD, Machine Learning, Summer School
Identifiers
Local EPrints ID: 470703
URI: http://eprints.soton.ac.uk/id/eprint/470703
PURE UUID: a843c03a-5e6a-458c-861d-d33f9a73d468
Catalogue record
Date deposited: 18 Oct 2022 16:42
Last modified: 17 Mar 2024 03:52
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Contributors
Author:
Peng Bao
Author:
Jack Macklin
Editor:
Mahesan Niranjan
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