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Effect of POSS on the dielectric properties of thermally-aged epoxy resin insulating materials

Effect of POSS on the dielectric properties of thermally-aged epoxy resin insulating materials
Effect of POSS on the dielectric properties of thermally-aged epoxy resin insulating materials
Polyhedral oligomeric silsesquioxane (POSS) can significantly improve the short-term insulation ability of epoxy materials under high electric field, which makes epoxy/POSS composites show a wide application prospect in high-voltage power equipment. The changes in performance due to aging is the concern of the long-term application of epoxy materials in power equipment. Therefore, the influence of Glycidyl POSS on the insulation performance of epoxy materials in the aging process needs to be investigated. In this paper, different mass fractions of epoxy/POSS composites were prepared and the effect of POSS on the dielectric loss of epoxy materials after thermal aging was investigated. The results show that the addition of a small amount of POSS can effectively inhibit the low-frequency dielectric loss of epoxy insulating materials during thermal aging. Combined with the DC volume resistivity test of epoxy composites and the quantum chemical calculation results of POSS molecules, a possible mechanism of POSS inhibiting the dielectric loss of epoxy resin during thermal aging was proposed. The present work provides a reference for further development of POSS in the field of electrical insulation and the application of POSS modified composites in power equipment such as low-frequency transmission and DC transmission equipment.
POSS, dielectric loss, epoxy composite, quantum chemical calculation, thermal aging
1109/TDEI.2022.3194492
Chen, George
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Shi, Yinjun
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Zhao, Yushun
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Gong, Chao
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Xu, Yufan
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Du, Bin
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Li, Dengyun
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Chen, George
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Shi, Yinjun
cacf949b-87dc-4aa8-b92b-b9ee7ed2efbc
Zhao, Yushun
643f7f0b-59e7-433c-ab2d-42f862257f18
Gong, Chao
e9c56505-4c1d-43fc-8ed2-6b702f84019d
Xu, Yufan
2abfcdfc-0cd5-4ef6-b32e-8d15307f50bd
Du, Bin
d5280b0c-1c38-497f-b904-efcf33f787fb
Li, Dengyun
f21d86d1-861d-4827-beee-442975445028

Chen, George, Shi, Yinjun, Zhao, Yushun, Gong, Chao, Xu, Yufan, Du, Bin and Li, Dengyun (2022) Effect of POSS on the dielectric properties of thermally-aged epoxy resin insulating materials. IEEE Transaction on Dielectrics and Electrical Insulation. (1109/TDEI.2022.3194492). (In Press)

Record type: Article

Abstract

Polyhedral oligomeric silsesquioxane (POSS) can significantly improve the short-term insulation ability of epoxy materials under high electric field, which makes epoxy/POSS composites show a wide application prospect in high-voltage power equipment. The changes in performance due to aging is the concern of the long-term application of epoxy materials in power equipment. Therefore, the influence of Glycidyl POSS on the insulation performance of epoxy materials in the aging process needs to be investigated. In this paper, different mass fractions of epoxy/POSS composites were prepared and the effect of POSS on the dielectric loss of epoxy materials after thermal aging was investigated. The results show that the addition of a small amount of POSS can effectively inhibit the low-frequency dielectric loss of epoxy insulating materials during thermal aging. Combined with the DC volume resistivity test of epoxy composites and the quantum chemical calculation results of POSS molecules, a possible mechanism of POSS inhibiting the dielectric loss of epoxy resin during thermal aging was proposed. The present work provides a reference for further development of POSS in the field of electrical insulation and the application of POSS modified composites in power equipment such as low-frequency transmission and DC transmission equipment.

Text
Effect of POSS on the Dielectric Properties of Thermally-Aged Epoxy Resin Insulating Materials - Accepted Manuscript
Restricted to Repository staff only until 15 July 2024.
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More information

Accepted/In Press date: 15 July 2022
Keywords: POSS, dielectric loss, epoxy composite, quantum chemical calculation, thermal aging

Identifiers

Local EPrints ID: 471488
URI: http://eprints.soton.ac.uk/id/eprint/471488
DOI: 1109/TDEI.2022.3194492
PURE UUID: 89ec0098-1d2b-4c1e-9d98-f74da8b80abc

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Date deposited: 09 Nov 2022 17:56
Last modified: 09 Nov 2022 17:56

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Contributors

Author: George Chen
Author: Yinjun Shi
Author: Yushun Zhao
Author: Chao Gong
Author: Yufan Xu
Author: Bin Du
Author: Dengyun Li

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