AdvanCT EURAMET project, Southampton XCT scan data, NPL sample, slow scan
AdvanCT EURAMET project, Southampton XCT scan data, NPL sample, slow scan
AdvanCT EURAMET project, Southampton XCT scan data, NPL sample, slow scan 20190312_HUTCH_2220_NPL_Long225_001 NPL phantom - aluminium Data acquisition system: Custom Nikon metrology custom x-ray tomography system Detector: PerkinElmer XRD 1621 CN3 – HS, 2000x2000 pixels, 200 μm2 pixel size. Nikon 225kVp reflection target microfocus source 134ms exposure per frame averaged over 16 frames, 160kVp, 142 μA, 3143 projections, 185 minutes, shuttling, stop start scanning mode S2O: 255.7822265625 S2D: 895.7499
Lindroos, Reuben
d448b02f-b678-4cf8-ae23-5c7efb0b30e0
Towsyfyan, Hossein
f1f4fa2a-20e4-4519-a66b-2faecb50173d
Blumensath, Thomas
470d9055-0373-457e-bf80-4389f8ec4ead
Biguri, Ander
738d1b66-9a99-446f-805d-032dd12445e3
Deyhle, Hans
aba9cd34-97a0-4238-8255-af673e3beb1a
Lindroos, Reuben
d448b02f-b678-4cf8-ae23-5c7efb0b30e0
Towsyfyan, Hossein
f1f4fa2a-20e4-4519-a66b-2faecb50173d
Blumensath, Thomas
470d9055-0373-457e-bf80-4389f8ec4ead
Biguri, Ander
738d1b66-9a99-446f-805d-032dd12445e3
Deyhle, Hans
aba9cd34-97a0-4238-8255-af673e3beb1a
Abstract
AdvanCT EURAMET project, Southampton XCT scan data, NPL sample, slow scan 20190312_HUTCH_2220_NPL_Long225_001 NPL phantom - aluminium Data acquisition system: Custom Nikon metrology custom x-ray tomography system Detector: PerkinElmer XRD 1621 CN3 – HS, 2000x2000 pixels, 200 μm2 pixel size. Nikon 225kVp reflection target microfocus source 134ms exposure per frame averaged over 16 frames, 160kVp, 142 μA, 3143 projections, 185 minutes, shuttling, stop start scanning mode S2O: 255.7822265625 S2D: 895.7499
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More information
Published date: 14 November 2019
Identifiers
Local EPrints ID: 475758
URI: http://eprints.soton.ac.uk/id/eprint/475758
PURE UUID: 99cf49b4-43fa-44e8-8dbe-47262940b81b
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Date deposited: 27 Mar 2023 16:49
Last modified: 19 Jul 2023 01:41
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Contributors
Contributor:
Reuben Lindroos
Contributor:
Hossein Towsyfyan
Contributor:
Ander Biguri
Contributor:
Hans Deyhle
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