READ ME File For 'Dataset for Picophotonic localization metrology beyond thermal fluctuations'

Dataset DOI: 10.5258/SOTON/D2544.

ReadMe Author: Kevin MacDonald, University of Southampton

This dataset supports the publication: Picophotonic localization metrology beyond thermal fluctuations
AUTHORS: Cheng-Hung Chi, Tongjun Liu, Jun-Yu Ou, Jie Xu, Eng Aik Chan, Kevin F. MacDonald, and Nikolay I. Zheludev
TITLE: Picophotonic localization metrology beyond thermal fluctuations
JOURNAL: Nature Materials
PAPER DOI IF KNOWN: 

Contents
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This research data description should be read and understood in the context of the corresponding manuscript. The figure numbers correspond to the figure numbers of the manuscript and the data corresponds to the data as shown in the figures.
The figure descriptions as given in the corresponding manuscript are given below.  
The file contains the as-recorded (unprocessed, uncropped, etc.) image files from which Fig. 2 and Fig. S1c are derived.
[Figure 1 is a schematic graphic; Figure 3 shows the results of computatonal modelling, all details of which are contained within the manuscrip]

Fig. 2. Optical measurements of nanowire displacement. a,b, Optically measured versus actual values of nanowire displacement for plane-wave (a) and topologically structured
superoscillatory (b) illumination. Dotted lines above and below the ideal correlation diagonals are plotted at ±1 s.d. Dashed vertical lines denote minimum nanowire displacements that can be measured with accuracy exceeding 90% (relative error, <10%).

Fig. S1. Fig. S1. Nanowire position calibration. (a) SEM image of the entire nanowire sample, showing the electrode configuration for electrostatic cont rol of [ x direction] position; (b) representative pair of high magnification images of the ( y direction) midpoint of the nanowire from which the dependence of nanowire displacement on applied bias panel (c) is derived. [Error bars in (c) denote the unc ertainty associated with a 1 pixel error in determining the nanowire edge position from SEM images.

Geographic location of data collection: University of Southampton, U.K.

Related projects:
Next Generation Metrology Driven by Nanophotonics
EPSRC
EP/T02643X/1

Dataset available under a CC BY 4.0 licence