Nanometric position metrology with topologically structured light
Nanometric position metrology with topologically structured light
We introduce a new ‘optical ruler’ concept, which allows for single-shot, real-time detection of nanometric displacements down to λ/400, through the visualization of singularities in a topologically structured optical field using a polarization-sensitive camera.
Sam, Rhea
611db584-c44d-49aa-8894-f34b24ab7086
Ou, Jun-Yu
3fb703e3-b222-46d2-b4ee-75f296d9d64d
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
26 June 2023
Sam, Rhea
611db584-c44d-49aa-8894-f34b24ab7086
Ou, Jun-Yu
3fb703e3-b222-46d2-b4ee-75f296d9d64d
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
Sam, Rhea, Ou, Jun-Yu, MacDonald, Kevin F. and Zheludev, Nikolai
(2023)
Nanometric position metrology with topologically structured light.
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference, International Congress Centre Munich, Munich, Germany.
26 - 30 Jun 2023.
Record type:
Conference or Workshop Item
(Paper)
Abstract
We introduce a new ‘optical ruler’ concept, which allows for single-shot, real-time detection of nanometric displacements down to λ/400, through the visualization of singularities in a topologically structured optical field using a polarization-sensitive camera.
Text
CLEO-europe - single-shot optical ruler
- Accepted Manuscript
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Published date: 26 June 2023
Venue - Dates:
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference, International Congress Centre Munich, Munich, Germany, 2023-06-26 - 2023-06-30
Identifiers
Local EPrints ID: 476848
URI: http://eprints.soton.ac.uk/id/eprint/476848
PURE UUID: f0f7b6cd-d10d-4530-88b9-3e7ac5b26150
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Date deposited: 17 May 2023 16:59
Last modified: 16 Apr 2024 04:01
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