VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Gaur, Manoj Singh
589ebe4b-7e06-4565-b109-8e268f8e12db
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Laxmi, Vijay
e79a9a3a-cd6b-45d6-8a03-9a5891453a95
Boolchandani, Dharmendra
3095a810-54e6-4ce6-a33d-100139421c8f
Singh, Virendra
77b562c6-008e-435c-800a-eb6652cc946b
Singh, Adit D.
aba27bd8-e44a-465b-9df1-eb8617bcc29f
2013
Gaur, Manoj Singh
589ebe4b-7e06-4565-b109-8e268f8e12db
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Laxmi, Vijay
e79a9a3a-cd6b-45d6-8a03-9a5891453a95
Boolchandani, Dharmendra
3095a810-54e6-4ce6-a33d-100139421c8f
Singh, Virendra
77b562c6-008e-435c-800a-eb6652cc946b
Singh, Adit D.
aba27bd8-e44a-465b-9df1-eb8617bcc29f
Gaur, Manoj Singh, Zwolinski, Mark, Laxmi, Vijay, Boolchandani, Dharmendra, Singh, Virendra and Singh, Adit D.
(eds.)
(2013)
VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
(Communications in Computer and Information Science, 382 CCIS),
vol. 382 CCIS,
Berlin, Heidelberg.
Springer, 388pp.
Abstract
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
This record has no associated files available for download.
More information
Published date: 2013
Venue - Dates:
17th International Symposium on VLSI Design and Test Symposium, VDAT 2013, , Jaipur, India, 2013-07-27 - 2013-07-30
Identifiers
Local EPrints ID: 477983
URI: http://eprints.soton.ac.uk/id/eprint/477983
ISSN: 1865-0929
PURE UUID: b37c4b8e-60ca-4dbe-a9d9-f5faed11a1b5
Catalogue record
Date deposited: 19 Jun 2023 16:40
Last modified: 18 Mar 2024 02:36
Export record
Altmetrics
Contributors
Editor:
Manoj Singh Gaur
Editor:
Mark Zwolinski
Editor:
Vijay Laxmi
Editor:
Dharmendra Boolchandani
Editor:
Virendra Singh
Editor:
Adit D. Singh
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics