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The measurement threshold and limitations of an intra-oral scanner on polished human enamel

The measurement threshold and limitations of an intra-oral scanner on polished human enamel
The measurement threshold and limitations of an intra-oral scanner on polished human enamel
Objective
To investigate the measurement threshold of an intra-oral scanner (IOS) on polished human enamel.

Methods
The optical performance of an IOS was compared to a gold-standard non contacting laser profilometer (NCLP), on a painted microscope slide, compared to increasing particle size of silicon-carbide papers (21.8–269.0 μm) and separately on polished human enamel with increasing step-heights. The enamel samples were randomised (n = 80) and scanned using the IOS and NCLP at increasing step-height depths (μm) (1.87–86.46 μm) and quantified according to ISO:5436-1. The measurement threshold of the IOS was determined using a custom designed automated lesion localisation algorithm, corroborated by Gaussian skewness (Ssk) and kurtosis (Sku) analysis, to assess the minimum step-height measured on each enamel sample.

Results
The NCLP showed statistically increased Sq surface roughness for all silicon carbide particle sizes compared to the microscope slide, whereas, the IOS Sq roughness discriminated silicon-carbide particles above 68.0 μm compared to the glass slide (p ≤ 0.02). On polished enamel, the automated minimum detectable step-height measurable on each sample was 44 μm. No statistically significantly different step-height enamel lesion measurements were observed between NCLP and IOS above this threshold (p > 0.05).

Significance
This study revealed the fundamental optical metrological parameters for the IOS, was step-heights above 44 μm and this reflects the data acquisition of the system. These results highlight the limitations of IOS used in this study, mandating further research to optimise the performance of other IOS systems, for measuring wear of materials or tooth wear on human unpolished natural enamel surfaces.
0109-5641
Charalambous, Polyvios
bfa10a7b-3f1b-4d2d-8f9c-c7fa8276573d
O’Toole, Saoirse
ba57bb19-ebb6-439c-82c2-804f72985eda
Bull, Thomas
f3f00de4-1bfa-42c4-b957-dbd95a1a9aa2
Bartlett, David
ab469b46-fa27-43be-9be2-6b3335082d9b
Austin, Rupert
fe6534de-935d-490e-8ee0-e2fb3270d1a2
Charalambous, Polyvios
bfa10a7b-3f1b-4d2d-8f9c-c7fa8276573d
O’Toole, Saoirse
ba57bb19-ebb6-439c-82c2-804f72985eda
Bull, Thomas
f3f00de4-1bfa-42c4-b957-dbd95a1a9aa2
Bartlett, David
ab469b46-fa27-43be-9be2-6b3335082d9b
Austin, Rupert
fe6534de-935d-490e-8ee0-e2fb3270d1a2

Charalambous, Polyvios, O’Toole, Saoirse, Bull, Thomas, Bartlett, David and Austin, Rupert (2021) The measurement threshold and limitations of an intra-oral scanner on polished human enamel. Dental Materials, 37 (4). (doi:10.1016/j.dental.2021.01.006).

Record type: Article

Abstract

Objective
To investigate the measurement threshold of an intra-oral scanner (IOS) on polished human enamel.

Methods
The optical performance of an IOS was compared to a gold-standard non contacting laser profilometer (NCLP), on a painted microscope slide, compared to increasing particle size of silicon-carbide papers (21.8–269.0 μm) and separately on polished human enamel with increasing step-heights. The enamel samples were randomised (n = 80) and scanned using the IOS and NCLP at increasing step-height depths (μm) (1.87–86.46 μm) and quantified according to ISO:5436-1. The measurement threshold of the IOS was determined using a custom designed automated lesion localisation algorithm, corroborated by Gaussian skewness (Ssk) and kurtosis (Sku) analysis, to assess the minimum step-height measured on each enamel sample.

Results
The NCLP showed statistically increased Sq surface roughness for all silicon carbide particle sizes compared to the microscope slide, whereas, the IOS Sq roughness discriminated silicon-carbide particles above 68.0 μm compared to the glass slide (p ≤ 0.02). On polished enamel, the automated minimum detectable step-height measurable on each sample was 44 μm. No statistically significantly different step-height enamel lesion measurements were observed between NCLP and IOS above this threshold (p > 0.05).

Significance
This study revealed the fundamental optical metrological parameters for the IOS, was step-heights above 44 μm and this reflects the data acquisition of the system. These results highlight the limitations of IOS used in this study, mandating further research to optimise the performance of other IOS systems, for measuring wear of materials or tooth wear on human unpolished natural enamel surfaces.

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More information

Accepted/In Press date: 18 January 2021
Published date: 17 March 2021

Identifiers

Local EPrints ID: 478085
URI: http://eprints.soton.ac.uk/id/eprint/478085
ISSN: 0109-5641
PURE UUID: 5bfd1527-0e08-45d6-bef5-f437f4d35373

Catalogue record

Date deposited: 21 Jun 2023 16:53
Last modified: 17 Mar 2024 02:20

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Contributors

Author: Polyvios Charalambous
Author: Saoirse O’Toole
Author: Thomas Bull
Author: David Bartlett
Author: Rupert Austin

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