Gamma-induced Degradation Analysis of Commercial off-the-shelf Camera Sensors
Gamma-induced Degradation Analysis of Commercial off-the-shelf Camera Sensors
In this work, we investigated the degradation of commercial camera sensors exposed to 100 Gy of γ dose at dose rates of 0.55 Gy/min and 1.34 Gy/min respectively. The results show that the degradation is strongly dependent on the dose rate but doesnt vary much with the accumulation of dose at constant dose rate. Furthermore, cameras with in-built processing electronics are more susceptible to gamma radiations as compared to the cameras with sensing unit only.
Aslam, Bilal
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Saha, Sangeet
168b72f1-80f6-4847-aba8-7c5fb7fa22b0
Khanam, Zeba
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Zhai, Xiaojun
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Ehsan, Shoaib
ae8922f0-dbe0-4b22-8474-98e84d852de7
Stolkin, Rustam
b373b8ef-a044-4d01-85f0-5d242dc5a062
McDonald-Maier, Klaus
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October 2019
Aslam, Bilal
7583320c-0375-4983-ad1e-d7f0e9ea0042
Saha, Sangeet
168b72f1-80f6-4847-aba8-7c5fb7fa22b0
Khanam, Zeba
9b47373e-bfe7-4882-947c-a78db5e6e1cb
Zhai, Xiaojun
93ee3dbb-e10e-472b-adec-78acfcd4cbc7
Ehsan, Shoaib
ae8922f0-dbe0-4b22-8474-98e84d852de7
Stolkin, Rustam
b373b8ef-a044-4d01-85f0-5d242dc5a062
McDonald-Maier, Klaus
4429a771-384b-4cc6-8d45-1813c3792939
Aslam, Bilal, Saha, Sangeet, Khanam, Zeba, Zhai, Xiaojun, Ehsan, Shoaib, Stolkin, Rustam and McDonald-Maier, Klaus
(2019)
Gamma-induced Degradation Analysis of Commercial off-the-shelf Camera Sensors.
2019 IEEE Sensors, , Montreal, Canada.
27 - 30 Oct 2019.
4 pp
.
(doi:10.1109/SENSORS43011.2019.8956620).
Record type:
Conference or Workshop Item
(Paper)
Abstract
In this work, we investigated the degradation of commercial camera sensors exposed to 100 Gy of γ dose at dose rates of 0.55 Gy/min and 1.34 Gy/min respectively. The results show that the degradation is strongly dependent on the dose rate but doesnt vary much with the accumulation of dose at constant dose rate. Furthermore, cameras with in-built processing electronics are more susceptible to gamma radiations as compared to the cameras with sensing unit only.
UNSPECIFIED
AM Aslam et al 2019
- Accepted Manuscript
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Published date: October 2019
Venue - Dates:
2019 IEEE Sensors, , Montreal, Canada, 2019-10-27 - 2019-10-30
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Local EPrints ID: 478940
URI: http://eprints.soton.ac.uk/id/eprint/478940
PURE UUID: ae8baaad-edfe-4e70-8dec-4dcc5f6c0611
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Date deposited: 14 Jul 2023 16:58
Last modified: 01 Oct 2024 02:08
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Contributors
Author:
Bilal Aslam
Author:
Sangeet Saha
Author:
Zeba Khanam
Author:
Xiaojun Zhai
Author:
Shoaib Ehsan
Author:
Rustam Stolkin
Author:
Klaus McDonald-Maier
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