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Progression of the Advanced Bionics Ultra V1 issue over time: Evidence from Recording Electrode Voltages and Electric Field Imaging

Progression of the Advanced Bionics Ultra V1 issue over time: Evidence from Recording Electrode Voltages and Electric Field Imaging
Progression of the Advanced Bionics Ultra V1 issue over time: Evidence from Recording Electrode Voltages and Electric Field Imaging
Background and Aims:
Advanced Bionics Ultra V1 devices are vulnerable to partial short circuits, resulting from moisture ingress.
The aim of this study is to assess the extent to which 79 Advanced Bionics devices, supported by the University of Southampton Auditory Implant Service, are affected by the issue and how this has changed over time, with a view to predicting future service requirements.

Method
Devices were assessed by Recording Electrodes Voltages using surface electrodes (REVS test) and the manufacturer’s Electric Field Imaging (EFI) test. Children’s devices were assessed routinely, whilst those implanted in adults were assessed when concerns were raised, or the device reached 3-4 years old.
Electrode Voltages were measured for three montages whilst the implant was stimulated in live mode. Measured voltages were compared across electrodes and electrodes displaying a consistent drop in amplitude compared to adjacent electrodes in different montages were labelled as faulty. The manufacturer’s EFI analysis tool was used to interpret EFI results.

Results
138 REVS tests were performed over a 30 month period for 66 devices: 81 in adults and 57 in children. 17 devices were explanted due to faulty electrodes (range 1 to 15) and one was explanted for medical reasons, all of which were confirmed to have the fault when the explanted device was analysed. A further 35 devices still in situ were identified as having faulty electrode(s) (range 1 to 8), based on the REVS test. In 32 of the 66 devices tested, the issue had progressed sufficiently to register on the manufacturer’s EFI test.

Conclusions
These devices are widely affected by loss of volume, related to partial short circuits. In some cases it is possible to mitigate the effects by adjusting comfort levels, spanning or deactivating electrodes but the extent of the problem is sufficient to justify re-implantation in many cases.
Grasmeder, Mary
206e6b44-d1cd-43f5-99ac-588ab02d44ef
Aydin, Ziya
a59046ba-fde4-495b-ac92-a46a5391db6c
Hough, Kate
81d8630c-6e02-4bea-858a-377717476f6e
Richards, Jasmine
911a773a-7fa9-4454-8a9a-5d92d0481954
Newman, Tracey
322290cb-2e9c-445d-a047-00b1bea39a25
Verschuur, Carl
5e15ee1c-3a44-4dbe-ad43-ec3b50111e41
Grasmeder, Mary
206e6b44-d1cd-43f5-99ac-588ab02d44ef
Aydin, Ziya
a59046ba-fde4-495b-ac92-a46a5391db6c
Hough, Kate
81d8630c-6e02-4bea-858a-377717476f6e
Richards, Jasmine
911a773a-7fa9-4454-8a9a-5d92d0481954
Newman, Tracey
322290cb-2e9c-445d-a047-00b1bea39a25
Verschuur, Carl
5e15ee1c-3a44-4dbe-ad43-ec3b50111e41

Grasmeder, Mary, Aydin, Ziya, Hough, Kate, Richards, Jasmine, Newman, Tracey and Verschuur, Carl (2023) Progression of the Advanced Bionics Ultra V1 issue over time: Evidence from Recording Electrode Voltages and Electric Field Imaging. British Cochlear Implant Group Conference 2023, , Cambridge, United Kingdom. 13 - 14 Apr 2023.

Record type: Conference or Workshop Item (Poster)

Abstract

Background and Aims:
Advanced Bionics Ultra V1 devices are vulnerable to partial short circuits, resulting from moisture ingress.
The aim of this study is to assess the extent to which 79 Advanced Bionics devices, supported by the University of Southampton Auditory Implant Service, are affected by the issue and how this has changed over time, with a view to predicting future service requirements.

Method
Devices were assessed by Recording Electrodes Voltages using surface electrodes (REVS test) and the manufacturer’s Electric Field Imaging (EFI) test. Children’s devices were assessed routinely, whilst those implanted in adults were assessed when concerns were raised, or the device reached 3-4 years old.
Electrode Voltages were measured for three montages whilst the implant was stimulated in live mode. Measured voltages were compared across electrodes and electrodes displaying a consistent drop in amplitude compared to adjacent electrodes in different montages were labelled as faulty. The manufacturer’s EFI analysis tool was used to interpret EFI results.

Results
138 REVS tests were performed over a 30 month period for 66 devices: 81 in adults and 57 in children. 17 devices were explanted due to faulty electrodes (range 1 to 15) and one was explanted for medical reasons, all of which were confirmed to have the fault when the explanted device was analysed. A further 35 devices still in situ were identified as having faulty electrode(s) (range 1 to 8), based on the REVS test. In 32 of the 66 devices tested, the issue had progressed sufficiently to register on the manufacturer’s EFI test.

Conclusions
These devices are widely affected by loss of volume, related to partial short circuits. In some cases it is possible to mitigate the effects by adjusting comfort levels, spanning or deactivating electrodes but the extent of the problem is sufficient to justify re-implantation in many cases.

Text
BCIG poster 2023 AB Ultra V1 issue
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More information

Published date: 13 April 2023
Venue - Dates: British Cochlear Implant Group Conference 2023, , Cambridge, United Kingdom, 2023-04-13 - 2023-04-14

Identifiers

Local EPrints ID: 479010
URI: http://eprints.soton.ac.uk/id/eprint/479010
PURE UUID: fdb41175-f3d6-48ed-92c9-a43d8b100f69
ORCID for Kate Hough: ORCID iD orcid.org/0000-0002-5160-2517
ORCID for Tracey Newman: ORCID iD orcid.org/0000-0002-3727-9258

Catalogue record

Date deposited: 17 Jul 2023 16:57
Last modified: 30 Nov 2024 03:08

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Contributors

Author: Mary Grasmeder
Author: Ziya Aydin
Author: Kate Hough ORCID iD
Author: Jasmine Richards
Author: Tracey Newman ORCID iD
Author: Carl Verschuur

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