Versatile dispersion measurement via a reflective nonlinear interferometer
Versatile dispersion measurement via a reflective nonlinear interferometer
We present a novel dispersion measurement technique using a reflective common-path nonlinear interferometer. Our method is fast, alignment-free, and does not require phase-stabilization. It can extract the dispersion for samples with dispersion-length products as small as D × L ~0.007 ps/nm.
Riazi, Arash
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Chen, Changjia
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Zhu, Eric Y.
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Gladyshev, A. V.
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Kazansky, P. G.
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Sipe, J. E.
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Qian, Li
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15 May 2020
Riazi, Arash
e54caeb9-1266-4a98-82a4-d37969c9393f
Chen, Changjia
ab034b72-03b9-4e62-9815-bca04880b116
Zhu, Eric Y.
a5837a40-5106-401b-b2a7-f7b421325d02
Gladyshev, A. V.
f178f1b2-c3fa-4b63-96e8-b6e356218b84
Kazansky, P. G.
a5d123ec-8ea8-408c-8963-4a6d921fd76c
Sipe, J. E.
89e30cc3-3d6c-448a-854d-55219df47080
Qian, Li
1c01fe94-765e-4840-9194-c256e73ba836
Riazi, Arash, Chen, Changjia, Zhu, Eric Y., Gladyshev, A. V., Kazansky, P. G., Sipe, J. E. and Qian, Li
(2020)
Versatile dispersion measurement via a reflective nonlinear interferometer.
In Conference on Lasers and Electro-Optics : CLEO_SI 2020.
vol. Part F183-CLEO-,
OSA..
(doi:10.1364/CLEO_SI.2020.SF2B.4).
Record type:
Conference or Workshop Item
(Paper)
Abstract
We present a novel dispersion measurement technique using a reflective common-path nonlinear interferometer. Our method is fast, alignment-free, and does not require phase-stabilization. It can extract the dispersion for samples with dispersion-length products as small as D × L ~0.007 ps/nm.
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Published date: 15 May 2020
Venue - Dates:
CLEO: Science and Innovations, CLEO_SI 2020, , Washington, United States, 2020-05-10 - 2020-05-15
Identifiers
Local EPrints ID: 479311
URI: http://eprints.soton.ac.uk/id/eprint/479311
PURE UUID: fda7a278-ade0-42a8-ba6e-02c7149b64e0
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Date deposited: 20 Jul 2023 16:55
Last modified: 16 Mar 2024 23:49
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Contributors
Author:
Arash Riazi
Author:
Changjia Chen
Author:
Eric Y. Zhu
Author:
A. V. Gladyshev
Author:
J. E. Sipe
Author:
Li Qian
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