Coherent X-ray diffraction imaging of strain at the nanoscale
Coherent X-ray diffraction imaging of strain at the nanoscale
The understanding and management of strain is of fundamental importance in the design and implementation of materials. The strain properties of nanocrystalline materials are different from those of the bulk because of the strong influence of their surfaces and interfaces, which can be used to augment their function and introduce desirable characteristics. Here we explain how new X-ray diffraction techniques, which take advantage of the latest synchrotron radiation sources, can be used to obtain quantitative three-dimensional images of strain. These methods will lead, in the near future, to new knowledge of how nanomaterials behave within active devices and on unprecedented timescales.
291-298
Robinson, Ian K.
ce840296-d065-463a-9986-573de845a081
Harder, Ross
05fa0b22-abf6-4f59-9823-1748e879e27c
24 March 2009
Robinson, Ian K.
ce840296-d065-463a-9986-573de845a081
Harder, Ross
05fa0b22-abf6-4f59-9823-1748e879e27c
Newton, Marcus
fac92cce-a9f3-46cd-9f58-c810f7b49c7e
Robinson, Ian K. and Harder, Ross
(2009)
Coherent X-ray diffraction imaging of strain at the nanoscale.
Nature Materials, 8, .
(doi:10.1038/nmat2400).
Abstract
The understanding and management of strain is of fundamental importance in the design and implementation of materials. The strain properties of nanocrystalline materials are different from those of the bulk because of the strong influence of their surfaces and interfaces, which can be used to augment their function and introduce desirable characteristics. Here we explain how new X-ray diffraction techniques, which take advantage of the latest synchrotron radiation sources, can be used to obtain quantitative three-dimensional images of strain. These methods will lead, in the near future, to new knowledge of how nanomaterials behave within active devices and on unprecedented timescales.
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Published date: 24 March 2009
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Local EPrints ID: 479790
URI: http://eprints.soton.ac.uk/id/eprint/479790
ISSN: 1476-1122
PURE UUID: cc96501a-1fc9-48b0-b2de-53b49f443c8b
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Date deposited: 26 Jul 2023 17:03
Last modified: 17 Mar 2024 03:33
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Author:
Ian K. Robinson
Author:
Ross Harder
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