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Sub-ps 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxides and magnetron-sputtered metal oxide optical coatings

Sub-ps 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxides and magnetron-sputtered metal oxide optical coatings
Sub-ps 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxides and magnetron-sputtered metal oxide optical coatings

Crystalline sesquioxide films (Sc2O3, Y2O3, Lu2O3) produced by pulsed-laser deposition were examined for laser damage resistance with pulses of 500 fs duration, at a wavelength of 1030 nm and at a 10 Hz repetition rate. Comparable tests were performed with amorphous magnetron-sputtered thin films (SiO2, HfO2, Nb2O5). We found the laser-induced damage thresholds of the sesquioxides are close to those of HfO2 in the multi-pulse test regime. The results are the basis for designs of damage resistant reflective components used in ultrashort-pulse lasers.

Laser-induced damage testing, Metal oxides, Pulsed-laser deposition, Sesquioxides, Sub-picosecond regime
0277-786X
SPIE
Stehlík, Marek
1700b078-225f-44fa-a03c-e2b4f6583187
Govindassamy, Goby
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Zideluns, Janis
fd6fdf4a-4cc2-435c-8814-83eefe68bcec
Lemarchand, Fabien
db848698-a70b-41d4-aed0-cf334e9661eb
Wagner, Frank
1f8d1a50-e21c-4dc3-9e07-f72d2da5cf66
Lumeau, Julien
ff181650-ed88-4ef7-8962-8a19abbdc7ab
Mackenzie, Jacob
1d82c826-fdbf-425b-ac04-be43ccf12008
Gallais, Laurent
4acfdda7-8020-4865-a7d6-6ee854c357c7
Carr, Christopher Wren
Ristau, Detlev
Menoni, Carmen S.
Stehlík, Marek
1700b078-225f-44fa-a03c-e2b4f6583187
Govindassamy, Goby
759ac977-bbd5-48e3-b98a-8c5fd0dbfafe
Zideluns, Janis
fd6fdf4a-4cc2-435c-8814-83eefe68bcec
Lemarchand, Fabien
db848698-a70b-41d4-aed0-cf334e9661eb
Wagner, Frank
1f8d1a50-e21c-4dc3-9e07-f72d2da5cf66
Lumeau, Julien
ff181650-ed88-4ef7-8962-8a19abbdc7ab
Mackenzie, Jacob
1d82c826-fdbf-425b-ac04-be43ccf12008
Gallais, Laurent
4acfdda7-8020-4865-a7d6-6ee854c357c7
Carr, Christopher Wren
Ristau, Detlev
Menoni, Carmen S.

Stehlík, Marek, Govindassamy, Goby, Zideluns, Janis, Lemarchand, Fabien, Wagner, Frank, Lumeau, Julien, Mackenzie, Jacob and Gallais, Laurent (2022) Sub-ps 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxides and magnetron-sputtered metal oxide optical coatings. Carr, Christopher Wren, Ristau, Detlev and Menoni, Carmen S. (eds.) In 54th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials 2022. vol. 12300, SPIE. 13 pp . (doi:10.1117/12.2641792).

Record type: Conference or Workshop Item (Paper)

Abstract

Crystalline sesquioxide films (Sc2O3, Y2O3, Lu2O3) produced by pulsed-laser deposition were examined for laser damage resistance with pulses of 500 fs duration, at a wavelength of 1030 nm and at a 10 Hz repetition rate. Comparable tests were performed with amorphous magnetron-sputtered thin films (SiO2, HfO2, Nb2O5). We found the laser-induced damage thresholds of the sesquioxides are close to those of HfO2 in the multi-pulse test regime. The results are the basis for designs of damage resistant reflective components used in ultrashort-pulse lasers.

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Published date: 2 December 2022
Additional Information: Funding Information: This project has received funding from the European Union’s Horizon 2020 research and innovation programme under the Marie Sk lodowska-Curie grant agreement No 813159. The authors acknowledge the EPSRC for financial support of the Rigaku SmartLab via grants (EP/K009877/1), (EP/K00509X/1) and (EP/V035975/1), an EPSRC Doctoral Prize EP/T517859/1, and grant nos. EP/N018281/1 and EP/P027644/1.
Venue - Dates: 54th Annual Laser Damage Symposium - Laser-Induced Damage in Optical Materials 2022, , Rochester, United States, 2022-09-18 - 2022-09-21
Keywords: Laser-induced damage testing, Metal oxides, Pulsed-laser deposition, Sesquioxides, Sub-picosecond regime

Identifiers

Local EPrints ID: 481818
URI: http://eprints.soton.ac.uk/id/eprint/481818
ISSN: 0277-786X
PURE UUID: 6c073fe5-38d7-488b-8daa-a3dc4cede29e
ORCID for Jacob Mackenzie: ORCID iD orcid.org/0000-0002-3355-6051

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Date deposited: 08 Sep 2023 16:49
Last modified: 18 Mar 2024 02:52

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Contributors

Author: Marek Stehlík
Author: Goby Govindassamy
Author: Janis Zideluns
Author: Fabien Lemarchand
Author: Frank Wagner
Author: Julien Lumeau
Author: Jacob Mackenzie ORCID iD
Author: Laurent Gallais
Editor: Christopher Wren Carr
Editor: Detlev Ristau
Editor: Carmen S. Menoni

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