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Dielectric permittivity and breakdown strength of thermally aged polypropylene/ultra‒high molecular weight polyethylene nanocomposites

Dielectric permittivity and breakdown strength of thermally aged polypropylene/ultra‒high molecular weight polyethylene nanocomposites
Dielectric permittivity and breakdown strength of thermally aged polypropylene/ultra‒high molecular weight polyethylene nanocomposites
This study investigates the effects of thermal aging on PP/UHMWPE blends and PP/UHMWPE/MgO nanocomposites. Thermal degradation of the aged materials is evaluated using thermogravimetric analysis, showing a reduction in the onset degradation temperatures for both systems. PP/UHMWPE/MgO demonstrates better thermal stability than PP/UHMWPE. Fourier transform infrared spectroscopy is employed to analyze the surface chemical modifications in the aged samples. The findings indicate the formation of carbonyl groups, with PP/UHMWPE/MgO displaying lower rates of oxidation compared to PP/UHMWPE. Relative permittivity increases with aging time, but the increase is less pronounced in the PP/UHMWPE/MgO. The presence of a dielectric relaxation peak at varying frequencies, with PP/UHMWPE exhibiting higher frequencies, is observed. AC breakdown strength gradually decreases with increasing aging time in both sample types, albeit to a lesser extent in the nanocomposites. Overall, the study demonstrates that the addition of MgO in PP/UHMWPE nanocomposites under thermal aging has a mitigated impact on thermal stability, oxidation reactions, dielectric permittivity, and AC breakdown strength when compared to PP/UHMWPE blends.
Ketsamee, Phichet
320757bd-99cd-43d2-a8e8-b8100f15f461
Saeedi, Istebreq
6df4dfcf-9bb8-4edc-952e-ccc4841f7b54
Vaughan, Alun
6d813b66-17f9-4864-9763-25a6d659d8a3
Andritsch, Thomas
8681e640-e584-424e-a1f1-0d8b713de01c
Ketsamee, Phichet
320757bd-99cd-43d2-a8e8-b8100f15f461
Saeedi, Istebreq
6df4dfcf-9bb8-4edc-952e-ccc4841f7b54
Vaughan, Alun
6d813b66-17f9-4864-9763-25a6d659d8a3
Andritsch, Thomas
8681e640-e584-424e-a1f1-0d8b713de01c

Ketsamee, Phichet, Saeedi, Istebreq, Vaughan, Alun and Andritsch, Thomas (2023) Dielectric permittivity and breakdown strength of thermally aged polypropylene/ultra‒high molecular weight polyethylene nanocomposites. IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2023), Hilton Meadowlands Hotel, 2 Meadowlands Plaza, East Rutherford , New Jersey, United States. 15 - 19 Oct 2023. 4 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

This study investigates the effects of thermal aging on PP/UHMWPE blends and PP/UHMWPE/MgO nanocomposites. Thermal degradation of the aged materials is evaluated using thermogravimetric analysis, showing a reduction in the onset degradation temperatures for both systems. PP/UHMWPE/MgO demonstrates better thermal stability than PP/UHMWPE. Fourier transform infrared spectroscopy is employed to analyze the surface chemical modifications in the aged samples. The findings indicate the formation of carbonyl groups, with PP/UHMWPE/MgO displaying lower rates of oxidation compared to PP/UHMWPE. Relative permittivity increases with aging time, but the increase is less pronounced in the PP/UHMWPE/MgO. The presence of a dielectric relaxation peak at varying frequencies, with PP/UHMWPE exhibiting higher frequencies, is observed. AC breakdown strength gradually decreases with increasing aging time in both sample types, albeit to a lesser extent in the nanocomposites. Overall, the study demonstrates that the addition of MgO in PP/UHMWPE nanocomposites under thermal aging has a mitigated impact on thermal stability, oxidation reactions, dielectric permittivity, and AC breakdown strength when compared to PP/UHMWPE blends.

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e-pub ahead of print date: 16 October 2023
Venue - Dates: IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2023), Hilton Meadowlands Hotel, 2 Meadowlands Plaza, East Rutherford , New Jersey, United States, 2023-10-15 - 2023-10-19
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Identifiers

Local EPrints ID: 484126
URI: http://eprints.soton.ac.uk/id/eprint/484126
PURE UUID: baf3da57-81aa-405b-927a-ffa87427a8a4
ORCID for Phichet Ketsamee: ORCID iD orcid.org/0000-0003-1733-6806
ORCID for Istebreq Saeedi: ORCID iD orcid.org/0000-0002-1254-748X
ORCID for Alun Vaughan: ORCID iD orcid.org/0000-0002-0535-513X
ORCID for Thomas Andritsch: ORCID iD orcid.org/0000-0002-3462-022X

Catalogue record

Date deposited: 10 Nov 2023 17:57
Last modified: 18 Mar 2024 04:01

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Contributors

Author: Phichet Ketsamee ORCID iD
Author: Istebreq Saeedi ORCID iD
Author: Alun Vaughan ORCID iD
Author: Thomas Andritsch ORCID iD

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