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Size effect and electrical ageing of PDMS dielectric elastomer with competing failure modes

Size effect and electrical ageing of PDMS dielectric elastomer with competing failure modes
Size effect and electrical ageing of PDMS dielectric elastomer with competing failure modes
Large-scale dielectric elastomer generators dielectric elastomer generators (DEGs) such as those employed in wave energy converter projects require a significant volume of electrically stressed materials. Meanwhile, predictions of energy output from such systems are generally extrapolated from electrical and mechanical breakdown measurements performed on small scale samples, where the presence of small defects can be extremely small. This can lead to overly optimistic upscaled predictions for the performance and reliability of full-scale devices. In this study, multilayer DEGs were prepared to evaluate the dielectric breakdown strength of thin polydimethylsiloxane PDMS elastomer at different values of active areas. The results indicated the presence of two separate breakdown mechanisms resulting in an enhanced size effect and a reduced reliability for the larger samples. Electrical ageing tests were performed on three different sample geometries and the dielectric breakdown strength was found to be marginally affected by the time under stress. A Weibull competing failure model was applied to the distribution of experimental breakdowns and electrical reliability was accurately modeled over more than four decades of variation in the electrode area.
Dielectric breakdown strength, PDMS, competing failure modes, electrical ageing, size effect, competing failure mode, dielectric breakdown strength
0964-1726
Taine, Emmanuel
27a0e305-1b8d-4cb2-aa1c-726680149b2f
Andritsch, Thomas
8681e640-e584-424e-a1f1-0d8b713de01c
Saeedi, Istebreq A.
6df4dfcf-9bb8-4edc-952e-ccc4841f7b54
Morshuis, Peter H.F.
af303056-cf5a-4e71-8a85-4aacf69c9bb2
Taine, Emmanuel
27a0e305-1b8d-4cb2-aa1c-726680149b2f
Andritsch, Thomas
8681e640-e584-424e-a1f1-0d8b713de01c
Saeedi, Istebreq A.
6df4dfcf-9bb8-4edc-952e-ccc4841f7b54
Morshuis, Peter H.F.
af303056-cf5a-4e71-8a85-4aacf69c9bb2

Taine, Emmanuel, Andritsch, Thomas, Saeedi, Istebreq A. and Morshuis, Peter H.F. (2023) Size effect and electrical ageing of PDMS dielectric elastomer with competing failure modes. Smart Materials and Structures, 32 (10), [105021]. (doi:10.1088/1361-665X/acf53a).

Record type: Article

Abstract

Large-scale dielectric elastomer generators dielectric elastomer generators (DEGs) such as those employed in wave energy converter projects require a significant volume of electrically stressed materials. Meanwhile, predictions of energy output from such systems are generally extrapolated from electrical and mechanical breakdown measurements performed on small scale samples, where the presence of small defects can be extremely small. This can lead to overly optimistic upscaled predictions for the performance and reliability of full-scale devices. In this study, multilayer DEGs were prepared to evaluate the dielectric breakdown strength of thin polydimethylsiloxane PDMS elastomer at different values of active areas. The results indicated the presence of two separate breakdown mechanisms resulting in an enhanced size effect and a reduced reliability for the larger samples. Electrical ageing tests were performed on three different sample geometries and the dielectric breakdown strength was found to be marginally affected by the time under stress. A Weibull competing failure model was applied to the distribution of experimental breakdowns and electrical reliability was accurately modeled over more than four decades of variation in the electrode area.

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Size effect and electrical ageing of PDMS dielectric elastomer with competing failure modes - Accepted Manuscript
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Accepted/In Press date: 29 August 2023
Published date: 11 September 2023
Additional Information: Funding Information: This work was supported by SBM Offshore in the framework of the S3 Wave Energy Converter development. The authors would like to express their gratitude to Ronan Pin for his assistance with sample preparation and testing. Publisher Copyright: © 2023 The Author(s). Published by IOP Publishing Ltd.
Keywords: Dielectric breakdown strength, PDMS, competing failure modes, electrical ageing, size effect, competing failure mode, dielectric breakdown strength

Identifiers

Local EPrints ID: 484747
URI: http://eprints.soton.ac.uk/id/eprint/484747
ISSN: 0964-1726
PURE UUID: aad93f35-88b5-419a-b36a-0866f5f10ab3
ORCID for Thomas Andritsch: ORCID iD orcid.org/0000-0002-3462-022X
ORCID for Istebreq A. Saeedi: ORCID iD orcid.org/0000-0002-1254-748X

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Date deposited: 21 Nov 2023 17:32
Last modified: 18 Mar 2024 04:01

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Contributors

Author: Emmanuel Taine
Author: Thomas Andritsch ORCID iD
Author: Istebreq A. Saeedi ORCID iD
Author: Peter H.F. Morshuis

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