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Components for high speed atomic force microscopy

Components for high speed atomic force microscopy
Components for high speed atomic force microscopy
Many applications in materials science, life science and process control would benefit from atomic force microscopes (AFM) with higher scan speeds. To achieve this, the performance of many of the AFM components has to be increased. In this work, we focus on the cantilever sensor, the scanning unit and the data acquisition. We manufactured 10 ?m wide cantilevers which combine high resonance frequencies with low spring constants (160–360 kHz with spring constants of 1–5 pN/nm). For the scanning unit, we developed a new scanner principle, based on stack piezos, which allows the construction of a scanner with 15 ?m scan range while retaining high resonance frequencies (> 10 kHz). To drive the AFM at high scan speeds and record the height and error signal, we implemented a fast Data Acquisition (DAQ) system based on a commercial DAQ card and a LabView user interface capable of recording 30 frames per second at 150 x150 pixels.
atomic force microscopy (AFM), tip scanning instrument design and characterization, instrument control and alignment
0304-3991
881-887
Fantner, Georg E.
e95e5469-568d-4c76-843c-bb8a4f6153df
Schitter, Georg
a75aafc7-0804-4bbc-a2ee-792a17aed5fa
Kindt, J.H.
fc77f16c-0bb7-46ed-8fa9-3606fd1fc3ff
Ivanov, Tzvetan
7d723060-432f-4485-9988-4b6ccea0506c
Ivanova, Katarina
27b9ee6a-50d4-4c69-a588-1b29e21fdc30
Patel, Rohan
904b4087-5f77-4e74-ab36-3447d625fec5
Holten-Andersen, Niels
3be372e1-5a17-4a86-9808-a3e254aadb1b
Adams, Jonathan
60c7d6a7-9c02-4f4d-acec-3fcb54eec843
Thurner, Philipp J.
ab711ddd-784e-48de-aaad-f56aec40f84f
Rangelow, Ivo W.
f1d61c6f-f7f1-40b7-a0cf-ae7bceb04cac
Hansma, Paul K.
aeab95c4-0f23-4690-8302-72db3316215d
Fantner, Georg E.
e95e5469-568d-4c76-843c-bb8a4f6153df
Schitter, Georg
a75aafc7-0804-4bbc-a2ee-792a17aed5fa
Kindt, J.H.
fc77f16c-0bb7-46ed-8fa9-3606fd1fc3ff
Ivanov, Tzvetan
7d723060-432f-4485-9988-4b6ccea0506c
Ivanova, Katarina
27b9ee6a-50d4-4c69-a588-1b29e21fdc30
Patel, Rohan
904b4087-5f77-4e74-ab36-3447d625fec5
Holten-Andersen, Niels
3be372e1-5a17-4a86-9808-a3e254aadb1b
Adams, Jonathan
60c7d6a7-9c02-4f4d-acec-3fcb54eec843
Thurner, Philipp J.
ab711ddd-784e-48de-aaad-f56aec40f84f
Rangelow, Ivo W.
f1d61c6f-f7f1-40b7-a0cf-ae7bceb04cac
Hansma, Paul K.
aeab95c4-0f23-4690-8302-72db3316215d

Fantner, Georg E., Schitter, Georg, Kindt, J.H., Ivanov, Tzvetan, Ivanova, Katarina, Patel, Rohan, Holten-Andersen, Niels, Adams, Jonathan, Thurner, Philipp J., Rangelow, Ivo W. and Hansma, Paul K. (2006) Components for high speed atomic force microscopy. Ultramicroscopy, 106 (8-9), 881-887. (doi:10.1016/j.ultramic.2006.01.015).

Record type: Article

Abstract

Many applications in materials science, life science and process control would benefit from atomic force microscopes (AFM) with higher scan speeds. To achieve this, the performance of many of the AFM components has to be increased. In this work, we focus on the cantilever sensor, the scanning unit and the data acquisition. We manufactured 10 ?m wide cantilevers which combine high resonance frequencies with low spring constants (160–360 kHz with spring constants of 1–5 pN/nm). For the scanning unit, we developed a new scanner principle, based on stack piezos, which allows the construction of a scanner with 15 ?m scan range while retaining high resonance frequencies (> 10 kHz). To drive the AFM at high scan speeds and record the height and error signal, we implemented a fast Data Acquisition (DAQ) system based on a commercial DAQ card and a LabView user interface capable of recording 30 frames per second at 150 x150 pixels.

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More information

Published date: June 2006
Keywords: atomic force microscopy (AFM), tip scanning instrument design and characterization, instrument control and alignment

Identifiers

Local EPrints ID: 48814
URI: http://eprints.soton.ac.uk/id/eprint/48814
ISSN: 0304-3991
PURE UUID: f023513b-f6df-44f6-9b3b-a85d67a52411
ORCID for Philipp J. Thurner: ORCID iD orcid.org/0000-0001-7588-9041

Catalogue record

Date deposited: 15 Oct 2007
Last modified: 15 Mar 2024 09:50

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Contributors

Author: Georg E. Fantner
Author: Georg Schitter
Author: J.H. Kindt
Author: Tzvetan Ivanov
Author: Katarina Ivanova
Author: Rohan Patel
Author: Niels Holten-Andersen
Author: Jonathan Adams
Author: Ivo W. Rangelow
Author: Paul K. Hansma

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