Sample handler for x-ray tomographic microscopy and image-guided failure assessment
Sample handler for x-ray tomographic microscopy and image-guided failure assessment
X-ray tomographic microscopy (XTM) yields a three-dimensional data model of an investigated specimen. XTM providing micrometer resolution requires synchrotron light, high resolution area detectors, and a precise sample handler. The sample handler has a height of 270 mm only, is usable for 1 µm resolution, and is able to carry loading machines with a weight of up to 20 kg. This allows exposing samples to load between scans for image-guided failure assessment. This system has been used in the XTM end station of the materials science beamline of the Swiss Light Source at the Paul Scherrer Institut.
076106-[3pp]
Wyss, Peter
37835676-2f92-4df7-bc35-97b2c80c1104
Thurner, Philipp J.
ab711ddd-784e-48de-aaad-f56aec40f84f
Broenniman, Rolf
d3bbabac-65f4-4360-9c64-b01d97c8aa71
Stampanoni, Marco
bfedb3b0-01e8-4e1b-9163-41295b4ceeb1
Sennhauser, Urs
3c0e14aa-da0a-48da-bb7b-c65401b1d01b
Abela, Rafael
32050843-84a9-496b-bf7a-eb495e6a71df
Müller, Ralph
f881853a-540f-48f1-bb6d-e0cf1894e036
July 2005
Wyss, Peter
37835676-2f92-4df7-bc35-97b2c80c1104
Thurner, Philipp J.
ab711ddd-784e-48de-aaad-f56aec40f84f
Broenniman, Rolf
d3bbabac-65f4-4360-9c64-b01d97c8aa71
Stampanoni, Marco
bfedb3b0-01e8-4e1b-9163-41295b4ceeb1
Sennhauser, Urs
3c0e14aa-da0a-48da-bb7b-c65401b1d01b
Abela, Rafael
32050843-84a9-496b-bf7a-eb495e6a71df
Müller, Ralph
f881853a-540f-48f1-bb6d-e0cf1894e036
Wyss, Peter, Thurner, Philipp J., Broenniman, Rolf, Stampanoni, Marco, Sennhauser, Urs, Abela, Rafael and Müller, Ralph
(2005)
Sample handler for x-ray tomographic microscopy and image-guided failure assessment.
Review of Scientific Instruments, 76, .
(doi:10.1063/1.1979475).
Abstract
X-ray tomographic microscopy (XTM) yields a three-dimensional data model of an investigated specimen. XTM providing micrometer resolution requires synchrotron light, high resolution area detectors, and a precise sample handler. The sample handler has a height of 270 mm only, is usable for 1 µm resolution, and is able to carry loading machines with a weight of up to 20 kg. This allows exposing samples to load between scans for image-guided failure assessment. This system has been used in the XTM end station of the materials science beamline of the Swiss Light Source at the Paul Scherrer Institut.
This record has no associated files available for download.
More information
Published date: July 2005
Identifiers
Local EPrints ID: 48841
URI: http://eprints.soton.ac.uk/id/eprint/48841
ISSN: 0034-6748
PURE UUID: 67d240c5-4768-4fec-a678-9789e4462edd
Catalogue record
Date deposited: 16 Oct 2007
Last modified: 15 Mar 2024 09:50
Export record
Altmetrics
Contributors
Author:
Peter Wyss
Author:
Rolf Broenniman
Author:
Marco Stampanoni
Author:
Urs Sennhauser
Author:
Rafael Abela
Author:
Ralph Müller
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics
