Sample handler for x-ray tomographic microscopy and image-guided failure assessment


Wyss, Peter, Thurner, Philipp J., Broenniman, Rolf, Stampanoni, Marco, Sennhauser, Urs, Abela, Rafael and Müller, Ralph (2005) Sample handler for x-ray tomographic microscopy and image-guided failure assessment Review of Scientific Instruments, 76, 076106-[3pp]. (doi:10.1063/1.1979475).

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Description/Abstract

X-ray tomographic microscopy (XTM) yields a three-dimensional data model of an investigated specimen. XTM providing micrometer resolution requires synchrotron light, high resolution area detectors, and a precise sample handler. The sample handler has a height of 270 mm only, is usable for 1 µm resolution, and is able to carry loading machines with a weight of up to 20 kg. This allows exposing samples to load between scans for image-guided failure assessment. This system has been used in the XTM end station of the materials science beamline of the Swiss Light Source at the Paul Scherrer Institut.

Item Type: Article
Digital Object Identifier (DOI): doi:10.1063/1.1979475
ISSNs: 0034-6748 (print)
Subjects:


ePrint ID: 48841
Date :
Date Event
July 2005Published
Date Deposited: 16 Oct 2007
Last Modified: 16 Apr 2017 18:20
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/48841

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