An ultra-compact metasurface and specklemeter based chromatic confocal sensor
An ultra-compact metasurface and specklemeter based chromatic confocal sensor
The development of ultracompact lightweight optical instrumentation that can be used on-machine and to carry out in-process measurements is vital in realizing improved manufacturing processes, increasing the quality of parts being made while saving time and energy by reducing scrappage rates. Only incremental progress is being made in developing suitable instrumentation based on conventional components, such as traditional refractive elements, as fundamental limits in terms of size and weight are already reached. Here, we demonstrate a chromatic confocal sensor that utilizes the natural chromatic aberration found with a basic hyperbolic metalens to realize an ultracompact and simple probe. Furthermore, we demonstrate how this can be combined with a compact specklemeter as the detection element, thus realizing the whole sensing system in a compact manner. Even with the proof-of-principle instrument in its preliminary and unoptimized state, we achieve the successful recovery of the location of a scatterer, as it is scanned over a 227 μm range, with a standard deviation of error in the position of 1.37 μm. Sensors of this form can be deployed in areas where traditional instrumentation would typically impede the manufacturing processes, increasing the number of processes that can have metrology applied directly and providing real-time feedback to improve manufacturing outcomes.
chromatic confocal sensors, laser-writing, metalens, scattering flat fiber, speckle patterns, laser writing, Chromatic confocal sensors
1-8
Falak, Przemyslaw Ludwik
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Ho-Tin Chan, Justin
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Williamson, James
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Henning, Andrew
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Lee, Timothy
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Zahertar, Shahrzad
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Holmes, Christopher
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Beresna, Martynas
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Martin, Haydn
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Brambilla, Gilberto
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Jiang, Xiangqian
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26 March 2024
Falak, Przemyslaw Ludwik
f414a5d1-34e8-429d-8f9a-f203b6d83324
Ho-Tin Chan, Justin
2f2f6f73-b94c-4400-a1f2-b56a0a1e2124
Williamson, James
013aa177-1407-476d-bad1-aaa931c54ede
Henning, Andrew
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Lee, Timothy
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Zahertar, Shahrzad
9e9db9c7-0e1e-4d50-99b8-af23e09ab6ae
Holmes, Christopher
16306bb8-8a46-4fd7-bb19-a146758e5263
Beresna, Martynas
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Martin, Haydn
b6fb27bd-bd74-4131-be6d-979081c570fd
Brambilla, Gilberto
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Jiang, Xiangqian
9b2d5f21-a36d-4bd0-90ec-62160cb531df
Falak, Przemyslaw Ludwik, Ho-Tin Chan, Justin, Williamson, James, Henning, Andrew, Lee, Timothy, Zahertar, Shahrzad, Holmes, Christopher, Beresna, Martynas, Martin, Haydn, Brambilla, Gilberto and Jiang, Xiangqian
(2024)
An ultra-compact metasurface and specklemeter based chromatic confocal sensor.
IEEE Transactions on Instrumentation and Measurement, 73, , [5016208].
(doi:10.1109/TIM.2024.3381698).
Abstract
The development of ultracompact lightweight optical instrumentation that can be used on-machine and to carry out in-process measurements is vital in realizing improved manufacturing processes, increasing the quality of parts being made while saving time and energy by reducing scrappage rates. Only incremental progress is being made in developing suitable instrumentation based on conventional components, such as traditional refractive elements, as fundamental limits in terms of size and weight are already reached. Here, we demonstrate a chromatic confocal sensor that utilizes the natural chromatic aberration found with a basic hyperbolic metalens to realize an ultracompact and simple probe. Furthermore, we demonstrate how this can be combined with a compact specklemeter as the detection element, thus realizing the whole sensing system in a compact manner. Even with the proof-of-principle instrument in its preliminary and unoptimized state, we achieve the successful recovery of the location of a scatterer, as it is scanned over a 227 μm range, with a standard deviation of error in the position of 1.37 μm. Sensors of this form can be deployed in areas where traditional instrumentation would typically impede the manufacturing processes, increasing the number of processes that can have metrology applied directly and providing real-time feedback to improve manufacturing outcomes.
Text
P _Falak_IEEE_Transactions_Journal_Accepted_Pure_Version
- Accepted Manuscript
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Published date: 26 March 2024
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Publisher Copyright:
© 1963-2012 IEEE.
Keywords:
chromatic confocal sensors, laser-writing, metalens, scattering flat fiber, speckle patterns, laser writing, Chromatic confocal sensors
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Local EPrints ID: 488687
URI: http://eprints.soton.ac.uk/id/eprint/488687
ISSN: 0018-9456
PURE UUID: 0cfeb9c9-7655-4f2d-8363-6503c2c3d7a8
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Date deposited: 04 Apr 2024 16:41
Last modified: 15 May 2024 02:02
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Contributors
Author:
Przemyslaw Ludwik Falak
Author:
Justin Ho-Tin Chan
Author:
James Williamson
Author:
Andrew Henning
Author:
Haydn Martin
Author:
Xiangqian Jiang
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